Die folgenden Begriffe wurden einbezogen:
"electric field", "Elektrisches Feld", EF, 電界
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Deutsche Kommission Elektrotechnik Elektronik Informationstechnik in DIN und VDE (DKE),
DIN EN 60601-1-2 VDE 0750-1-2:2007-12
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2007,
Ideker RE, Dosdall DJ
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International Electrotechnical Commission (IEC),
IEC 62311:2007: 1-146
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2007 IEEE Power Engineering Society General Meeting, Tampa, FL, USA. IEEE: S. 1-5; ISBN 978-1-4244-1296-9
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2007,
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2007,
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2007,
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2007,
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PIERS 2007 Beijing: Progress In Electromagnetics Research Symposium, Beijing, China. The Electromagnetics Academy, Cambridge, MA: S. 1924-1928; ISBN 978-1-934142-00-4
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2007,
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2007,
Scientific Committee on Emerging and Newly Identified Health Risks (SCENIHR)
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2007,
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Weltgesundheitsorganisation (WHO),
1-8
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2007,
Gonzalez MC, Peratta A, Poljak D
IEEE Trans Electromagn Compat 49 (1): 153-162
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2007,
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2007,
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2007,
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2007,
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2007,
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2007,
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2007,
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2007,
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2007 29th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, Lyon, France. IEEE: S. 3552-3555; ISBN 978-1-4244-0787-3
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Eur Biophys J 36 (8): 967-972
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2007,
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2007,
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2007,
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2007,
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2007,
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Clin Tech Small Anim Pract 22 (4): 160-165
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2007,
van den Berg CA, van den Bergen B, Van de Kamer JB, Raaymakers BW, Kroeze H, Bartels LW, Lagendijk JJ
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2007,
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2007,
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2007,
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2007,
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2007,
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2007,
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2007 29th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, Lyon, France. IEEE: S. 419-422; ISBN 978-1-4244-0787-3
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2007,
Wang H, Liu F, Trakic A, Xia L, Crozier S
2007 29th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, Lyon, France. IEEE: S. 487-490; ISBN 978-1-4244-0787-3
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2007,
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2007,
Yabuhara T, Kato K, Tsuchiya K, Shigihara T, Shindo Y, Iwazaki R, Uzuka T, Fujii Y, Takahashi H
2007 29th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, Lyon, France. IEEE: S. 3540-3543; ISBN 978-1-4244-0787-3
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2007,
Perni S, Chalise PR, Shama G, Kong MG
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2007,
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2007 29th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, Lyon, France. IEEE: S. 1196-1199; ISBN 978-1-4244-0787-3
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2007,
Mi Y, Sun C, Yao C, Li C, Mo D, Tang L, Liu H
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