キーワード:
Elektrosensibilität, "elektromagnetische Hypersensitivität", Elektrosensitivität, EHS, "electromagnetic hypersensitivity", electrosensibility, electrosensitivity, 電気感受性、電磁過敏症
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2018,
Irigaray P, Caccamo D, Belpomme D
Int J Mol Med 42 (4): 1885-1898
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2018,
Verrender A, Loughran SP, Dalecki A, Freudenstein F, Croft RJ
Environ Res 166: 409-417
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2018,
Carboni C, Fornari A, Bragante KC, Averbeck MA, Vianna da Rosa P, Mea Plentz RD
Int J Impot Res 30 (3): 97-101
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2018,
Gruber MJ, Palmquist E, Nordin S
Scand J Psychol 59 (4): 422-427
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2018,
Babona-Pilipos R, Liu N, Pritchard-Oh A, Mok A, Badawi D, Popovic MR, Morshead CM
Exp Cell Res 368 (2): 202-214
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Environ Res 165: 484-495
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2018,
Claeson AS, Palmquist E, Nordin S
Int J Hyg Environ Health 221 (3): 586-592
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2018,
Huang PC, Cheng MT, Guo HR
Environ Health 17: 5
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2018,
Toloza EHS, Negahbani E, Fröhlich F
J Neurophysiol 119 (3): 1029-1036
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2018,
Huang PC, Li KH, Guo HR
Environ Res 161: 329-335
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2018,
Karvala K, Sainio M, Palmquist E, Nyback MH, Nordin S
Environ Res 161: 220-228
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2018,
Verrender A, Loughran SP, Anderson V, Hillert L, Rubin GJ, Oftedal G, Croft RJ
Bioelectromagnetics 39 (2): 132-143
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2018,
Witthöft M, Freitag I, Nußbaum C, Bräscher AK, Jasper F, Bailer J, Rubin GJ
Psychol Health 33 (3): 361-380
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2017,
Parsaei H, Faraz M, Mortazavi SMJ
Ecopsychology 9 (2): 99-105
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Ecopsychology 9 (2): 106-111
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NHK 1: 22-25
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2017,
Marshall TG, Heil TJR
Immunol Res 65 (1): 129-135
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2017,
Heuser G, Heuser SA
Rev Environ Health 32 (4): 379-380
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2017,
Dürrenberger G, Leuchtmann P, Röösli M, Siegrist M, Sütterlin B
Swiss Federal Office of Energy (SFOE),
Statusbericht 2017: 1-125
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2017,
Andrianome S, Hugueville L, de Seze R, Selmaoui B
Int J Radiat Biol 93 (8): 841-848
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2017,
Heuser G, Heuser SA
Rev Environ Health 32 (3): 291-299
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2017,
Modolo J, Thomas AW, Legros A
Bioelectromagnetics 38 (6): 425-435
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2017,
Andrianome S, Gobert J, Hugueville L, Stéphan-Blanchard E, Telliez F, Selmaoui B
J Appl Physiol 123 (5): 1055-1062
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2017,
Bräscher AK, Raymaekers K, Van den Bergh O, Witthöft M
Environ Res 156: 265-271
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Wiley-IEEE Press; ISBN 978-1-119-33316-6