Die folgenden Begriffe wurden einbezogen:
t-Test, "Student's t-test", スチューデントt-検定, t-検定
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2020,
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2020,
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2020,
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2020,
Yuan J, Chen Y, Yu P, Luo F, Gao Y, Chen J, Wang P, Wang Y, Zhao Y, Lei Y
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2020,
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2020,
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2020,
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2020,
Párraga DG, Tyack PL, Marco-Cabedo V, Crespo-Picazo JL, Manteca X, Martí-Bonmatí L
PLoS One 15 (12): e0241280
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2020,
Zradziński P, Karpowicz J, Gryz K, Morzyński L, Młyński R, Swidziński A, Godziszewski K, Ramos V
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2020,
Tang B, Shen X, Ye G, Yang Y, Jiang Y, Xia H, Chen X
ACS Biomater Sci Eng 6 (12): 6864-6873
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2020,
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Adv Ther 37 (5): 2390-2412
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2020,
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2020 IEEE Problems of Automated Electrodrive. Theory and Practice (PAEP), Kremenchuk, Ukraine. IEEE: S. 1-5; ISBN 978-1-7281-9936-8
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2020,
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2020,
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2020,
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2020,
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2020,
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2020,
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2020,
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2020,
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2020 IEEE Canadian Conference on Electrical and Computer Engineering (CCECE), London, ON, Canada. IEEE: S. 1-4; ISBN 978-1-7281-5443-5
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2020,
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2020,
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2020,
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2020,
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2020,
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2020,
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2020,
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2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: S. 1-4; ISBN 978-1-7281-5580-7
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2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: S. 1-6; ISBN 978-1-7281-5580-7
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2020,
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2020,
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2020,
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2020,
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2020,
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2020,
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2020 IEEE Energy Conversion Congress and Exposition (ECCE), Detroit, MI, USA. IEEE: S. 5185-5192; ISBN 978-1-7281-5827-3
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International Electrotechnical Commission (IEC), Institute of Electrical and Electronics Engineers (IEEE),
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2020,
Cywiak C, Ashbaugh RC, Metto AC, Udpa L, Qian C, Gilad AA, Reimers M, Zhong M, Pelled G
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2020,
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2020 XXXIIIrd General Assembly and Scientific Symposium of the International Union of Radio Science, Rome, Italy. IEEE: S. 1-4; ISBN 978-1-7281-5690-3
