-
2008,
Halperin D, Heydt-Benjamin TS, Ransford B, Clark SS
2008 IEEE Symposium on Security and Privacy (sp 2008), Oakland, CA, USA. IEEE: 129-142; ISBN 978-0-7695-3168-7
-
IET Sci Meas Technol 2 (6): 455-466
-
IEEE Antennas Wirel Propag Lett 7: 625-628
-
2008,
Fleury V, Kleinig TJ, Thompson PD, Ravindran J
J Clin Neurosci 15 (2): 210-212
-
2008,
Van Riet J, Mortelmans L
Eur J Nucl Med Mol Imaging 35 (2): 448
-
2008,
Fu PK, Hsu HY, Wang PY
J Chin Med Assoc 71 (3): 152-154
-
2008,
Memon AR, Tahir SM, Memon FM, Hashmi F, Shaikh BF
J Coll Physicians Surg Pak 18 (4): 201-204
-
2008,
Ogilvie MP, Panthaki ZJ
J Craniofac Surg 19 (4): 1040-1046
-
2008,
Hashemi H, Jabbarvand M, Mohammadpour M
J Cataract Refract Surg 34 (8): 1409-1412
-
2008,
Narang S, Mishra BB, Singh H, Banerjee A
Indian J Chest Dis Allied Sci 50 (4): 353
-
2008,
Kingsly Paul M, Dhanraj P, Gupta A
Burns 34 (6): 888-890
-
Burns 34 (4): 539-542
-
[詳細]
[高電圧の電気的脳傷害]
[elec. inj.]
J Trauma 64 (3): 843-845
-
Conservation Evidence 5: 83-91
-
2008,
Haberkern M, Martinolli L
ZFA 84 (6): 246-251
-
2008,
Dzhokic G, Jovchevska J, Dika A
Maced J Med Sci 1 (2): 54-58
-
2008,
Ben Hadj Slama J, Chariag D
J Electr Syst 4 (2): 1-12
-
2008,
Kulipanov GN, Gavrilov NG, Knyazev BA, Kolobanov EI, Kotenkov VV, Kubarev VV, Matveenko AN, Medvedev LE, Miginsky SV, Mironenko LA, Ovchar VK, Popik VM, Salikova TV, Scheglov MA, Serednyakov SS, Shevchenko OA, Skrinsky AN, Tcheskidov VG, Vinokurov NA, Demyanenko MA, Esaev DG, Naumova EV, Prinz VY, Fedin VP, Gonchar AM, Peltek SE, Petrov AK, Merzhievsky LA, Cherkassky VS
Terahertz Sci Technol 1 (2): 107-125
-
2008,
Xu LS, Meng MQH, Ren HL
PIERS Proceedings, Hangzhou, China. The Electromagnetics Academy: 893-897; ISBN 978-1-934142-04-2
-
2008,
Tadevosyan H, Kalantaryan V, Trchounian A
Cell Biochem Biophys 51 (2-3): 97-103
-
2008,
Lopez-Martin F, Bregains JC, Jorge-Barreiro FJ, Sebastian-Franco JL, Moreno-Piquero E, Ares-Pena FJ
Prog Electromagn Res 87: 149-165
-
2008,
Zygiridis TT, Tsiboukis TD
Progr Electromagn Res B (PIER B) 9: 83-96
-
J Electrost 66 (7-8): 417-420
-
2008,
Olshevskaya JS, Ratushnyak AS, Petrov AK, Kozlov AS, Zapara TA
2008 IEEE Region 8 International Conference on Computational Technologies in Electrical and Electronics Engineering, Novosibirsk, Russia. IEEE: 210-211; ISBN 978-1-4244-2133-6
-
2008,
Li M, Wang Y, Zhang Y, Zhou Z, Yu Z
J Radiat Res 49 (2): 163-170