-
2023,
Jamshed MA, Héliot F, Brown TWC, Ur Rehman M
Ur Rehman M, Jamshed MA (eds.): Low Electromagnetic Field Exposure Wireless Devices: Fundamentals and Recent Advances. Wiley-IEEE Press; pp. 225-236; ISBN 978-1-119-90916-3
-
2023,
Mittal P, Bohnert M
Forensic Sci Med Pathol 19 (1): 72-77
-
Environ Sci Pollut Res 30 (9): 23796-23809
-
2023,
Alawi M, Lee PF, Deng ZD, Goh YK, Croarkin PE
J Neural Eng 20 (2): 026016
-
2023,
Smith JR, DiSalvo M, Green A, Ceranoglu TA, Anteraper SA, Croarkin P, Joshi G
Neuropsychol Rev 33 (4): 834-855
-
2023,
Costantino C, Mazzucco W, Bonaccorso N, Sciortino M, Cimino L, Pizzo S, Conforto A, Calò I, Giliberti D, Gambino CR, Segreto D, Maiorana A, Vitale F, Casuccio A
Ann Ig 35 (3): 319-330
-
2023,
Qiu H, Liang K, Lu L, Gao Y, Li H, Hu X, Xing H, Huang X, Gong Q
J Affect Disord 320: 305-312
-
2023,
Yamazaki K, Ikeda-Araki A, Miyashita C, Tamura N, Yoshikawa T, Hikage T, Omiya M, Mizuta M, Ikuyo M, Tobita K, Onishi T, Taki M, Watanabe S, Kishi R
Environ Res 216 Pt 1: 114429
-
2023,
Rubino A, Bernardo P, Russo C, Tucci C, D'Amato L, Piccolo V, Andreone V, Striano P, Zito Marinosci G, Varone A
Brain Dev 45 (1): 87-91
-
2023,
Hardell L, Moskowitz JM
Rev Environ Health 38 (3): 409-421
-
2023,
Karatsi I, Bakogianni S, Koulouridis S
Int J Microw Wirel Technol 15 (2): 213-226
-
2023,
Brabant C, Geerinck A, Beaudart C, Tirelli E, Geuzaine C, Bruyère O
Rev Environ Health 38 (2): 229-253
-
2023,
Di Ciaula A, Bonfrate L, Noviello M, Portincasa P
Endocr Metab Immune Disord Drug Targets 23 (8): 1032 - 1040
-
2022,
Abbas IA, Youssef HM, El-Bary AA
Mathematics 10 (18): 3296
-
J Radiat Proc 40 (5): 050601
-
2022,
Chiwande SS, Meshram P, Charde A, Bhave S
2022 International Conference on Electronics and Renewable Systems (ICEARS), Tuticorin, India. IEEE: pp. 1865-1868; ISBN 978-1-6654-8426-8
-
2022,
Jiang F, Bhusal B, Sanpitak P, Webster G, Popescu A, Kim D, Bonmassar G, Golestanirad L
2022 44th Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC), Glasgow, Scotland, United Kingdom. IEEE: pp. 4014-4017; ISBN 978-1-7281-2783-5
-
2022,
Sullivan JS, Maitoza LA, Brysiewicz NR, Hall EK, Beach CM
Ann Pediatr Cardiol 15 (5-6): 533-535
-
2022 International Applied Computational Electromagnetics Society Symposium (ACES-China), Xuzhou, China. IEEE: pp. 1-3; ISBN 978-1-6654-5237-3
-
2022,
Bräunlich R, Dalmus C, Dongus S, Eberhard J, Friedrich G, Fröhlich J, Röösli M, Schürmann D
Swiss Federal Office of Energy (SFOE),
Statusbericht 2022: 1-204
-
2022,
Pudipeddi SS, Jayasree PVY
Eng Technol Appl Sci Res 12 (6): 9445-9449
-
2022,
Ben Saada A, Ben Mbarek S, Choubani F
Barolli L, Hussain F, Enokido T (eds.): Advanced Information Networking and Applications. Lecture Notes in Networks and Systems, 449巻; Springer, Cham; pp. 471-478; ISBN 978-3-030-99583-6
-
EMIE 2022; The 2nd International Conference on Electronic Materials and Information Engineering, Hangzhou, China. VDE: pp. 1-6; ISBN 978-3-8007-5961-3
-
2022,
Cresci A, Durif CMF, Larsen T, Bjelland R, Skiftesvik AB, Browman HI
PNAS Nexus 1 (4): pgac175
-
2022,
Amicucci GL, Settino MT
2022 International Conference on Electrical, Computer, Communications and Mechatronics Engineering (ICECCME), Maldives, Maldives. IEEE: pp. 1-7; ISBN 978-1-6654-7096-4
-
2022,
McCredden JE, Cook N, Weller S, Leach V
Front Public Health 10: 986315
-
2022,
Shaikh SA, Telang PA, Arora S
Cureus 14 (11): e31176
-
2022,
Rock M, Drebenstedt C
2022 36th International Conference on Lightning Protection (ICLP), Cape Town, South Africa. IEEE: pp. 614-619; ISBN 978-1-6654-9025-2
-
2022,
Mulatu D, Zewdie A, Zemede B, Terefe B, Liyew B
BMC Emerg Med 22: 199
-
2022,
Djuric N, Kljajic D, Otasevic V, Djuric S, Yin L
2022 4th International Conference on Emerging Trends in Electrical, Electronic and Communications Engineering (ELECOM), Mauritius. IEEE: pp. 1-6; ISBN 978-1-6654-6698-1
-
2022,
Baaken D, Erdmann F, Olsson A, Onyije FM, Schüz J, Wollschläger D
Federal Office for Radiation Protection (BfS),
Ressortforschungsberichte zum Strahlenschutz, BfS-RESFOR-206/22: 1-73
-
2022,
Pavel I, David V, Roman MG, Bordas AM
2022 International Conference and Exposition on Electrical And Power Engineering (EPE), Iasi, Romania. IEEE: pp. 484-488; ISBN 978-1-6654-8995-9
-
2022 Workshop on Microwave Theory and Techniques in Wireless Communications (MTTW), Riga, Latvia. IEEE: pp. 123-128; ISBN 978-1-6654-6440-6
-
2022,
Nakshine VS, Thute P, Khatib MN, Sarkar B
Cureus 14 (10): e30051
-
2022,
Iakovidis S, Apostolidis C, Manassas A, Samaras T
Sensors 22 (21): 8481
-
2022,
Hoang TT, Whitcomb E, Reardon EE, Spector LG, Lupo PJ, Scheurer ME, Williams LA
Curr Epidemiol Rep 9 (4): 338–360
-
2022,
SSM’s Scientific Council on Electromagnetic Fields
Swedish Radiation Safety Authority (SSM),
Report number: 2022:16: 1-100
-
2022,
Cui Y, Meng J, Luo K, Han J, Huang L, Zhu D
Rev Sci Instrum 93 (10): 104706
-
2022 23rd International Conference on Computational Problems of Electrical Engineering (CPEE), Zuberec, Slovakia. IEEE: pp. 1-4; ISBN 9798350396263
-
2022,
Azizi E, Ayoobi F, Shamsizadeh A, Moghadam-Ahmadi A, Shafiei SA, Khoshdel AR, Mirzaei MR
Basic Clin Neurosci 13 (4): 519-530
-
2022,
Kapetanović AL, Šušnjara A, Poljak D, Russo M
2022 International Conference on Software, Telecommunications and Computer Networks (SoftCOM), Split, Croatia. IEEE: pp. 1-5; ISBN 978-1-6654-7018-6
-
2022,
International Commission on the Biological Effects of Electromagnetic Fields (ICBE-EMF)
Environ Health 21: 92
-
2022,
Nitta RT, Luo EJ, Lim M, Li G
J Neurosurg Pediatr 30 (6): 555-566
-
2022,
Ozturk H, Venugopal S
Cureus 14 (8): e28259
-
2022,
Barbosa Filho JML, Campos MMdM, Flor DL, Alves WS, D’Assunção AG, Rodrigues MEC, de Sousa VAJr
Sensors 22 (18): 7017
-
2022,
Azaro R, Franchelli R, Gandolfo A
2022 IEEE International Symposium on Measurements & Networking (M&N), Padua, Italy. IEEE: pp. 1-5; ISBN 978-1-6654-8363-6
-
2022,
Chiaraviglio L, Lodovisi C, Franci D, Grillo E, Pavoncello S, Aureli T, Blefari-Melazzi N, Alouini MS
IEEE Open J Commun Soc 3: 1592-1614
-
2022,
Keshavarzi A, Rahgozar Z, Mortazavi M, Dehghani A
World J Plast Surg 11 (2): 102-109
-
Arch Electr Eng 71 (3): 755-773
-
2022,
Acri G, Anfuso C, Vermiglio G, Hartwig V
Electronics 11 (17): 2796
