Die folgenden Begriffe wurden einbezogen:
t-Test, "Student's t-test", スチューデントt-検定, t-検定
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2013,
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2013,
Ikinci A, Odaci E, Yildirim M, Kaya H, Akca M, Hanci H, Aslan A, Sönmez OF, Bas O
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2013,
Smitha CK, Narayanan NK
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Institute of Electrical and Electronics Engineers (IEEE),
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2013,
Juricev-Sudac L, Malaric K
2013 21st International Conference on Software, Telecommunications and Computer Networks - (SoftCOM 2013), Primosten. IEEE: S. 13917296; ISBN 978-953-290-040-8
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2013 IEEE Antennas and Propagation Society International Symposium (APSURSI), Orlando, FL, USA. IEEE: S. 1432-1433; ISBN 978-1-4673-5317-5
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2013,
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2013,
Othman MA, Abidin Abd.Aziz MZ, Sinnappa M, Ismail MM, Sulaiman HA, Harris Misran M, Ramlee RA, Meor Said MA
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2013,
Kljajic D, Djuric N, Kasas-Lazetic K
2013 IEEE International Conference on Computational Intelligence and Virtual Environments for Measurement Systems and Applications (CIVEMSA), Milan, Italy. IEEE: S. 126-131; ISBN 978-1-4673-4701-3
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2013,
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PCIC Europe 2013, Istanbul, Turkey, Istanbul, Turkey. IEEE: S. 13710764; ISBN 978-3-9524059-1-8
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2013,
Miclaus S, Iftode C, Colcieru M
2013 8th International Symposium on Advanced Topics in Electrical Engineering (ATEE), Bucharest. IEEE: S. 13778505; ISBN 978-1-4673-5979-5
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2013 IEEE International Conference on Control System, Computing and Engineering, Penang, Malaysia. IEEE: S. 321-324; ISBN 978-1-4799-1508-8
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2013,
Julstrom SD, Kozma-Spytek LK, Beard BB
IEEE Electromagn Compat Mag 2 (2): 69-81
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Melia GCR, Robinson MP, Flintoft ID, Marvin AC, Dawson JF
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2013,
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2013,
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