Die folgenden Begriffe wurden einbezogen:
Schwellenwert, "threshold value", threshold, 閾値
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2019,
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2019,
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2019,
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2019,
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J Neural Eng 16 (2): 026009
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2019,
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2019,
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2019,
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2019 IEEE Radio and Antenna Days of the Indian Ocean (RADIO), Reunion, France. IEEE: S. 1-2; ISBN 978-1-7281-2299-1
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2019,
Sakakibara K, Hikage T, Kageyama I, Masuda H
2019 IEEE Conference on Antenna Measurements & Applications (CAMA), Kuta, Bali, Indonesia. IEEE: S. 195-198; ISBN 978-1-7281-2397-4
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2019,
Kroll MW, Panescu D, Hirtler R, Koch M, Andrews CJ
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2019,
Kanaya K, Goto T, Horiuchi T, Hongo K
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2019,
Craddock M, Klepousniotou E, El-Deredy W, Poliakoff E, Lloyd D
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2019,
Ramger BC, Bader KA, Davies SP, Stewart DA, Ledbetter LS, Simon CB, Feld JA
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2019,
Thirugnanasambandam N, Contreras-Castro FG, Hallett M
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2019,
Bauer WR, Lau DH, Wollmann C, McGavigan A, Mansourati J, Reiter T, Frömer S, Ladd ME, Quick HH
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2019,
Contemori G, Trotter Y, Cottereau BR, Maniglia M
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2019,
Lorenzo MF, Thomas SC, Kani Y, Hinckley J, Lee M, Adler J, Verbridge SS, Hsu FC, Robertson JL, Davalos RV, Rossmeisl Jr JH
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2019,
Gomez-Tames J, Rashed E, Hirata A, Tarnaud T, Tanghe E, Van de Steene T, Martens L, Joseph W
2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Sapporo/APEMC), Sapporo, Japan. IEEE: S. 162-165; ISBN 978-1-7281-1639-6
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2019,
Rubin AE, Usta OB, Schloss R, Yarmush M, Golberg A
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2019,
Caetano A, Pereira P, Pereira M, de Carvalho M
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2019,
Tang ZM, Xuan CY, Li X, Dou ZL, Lan YJ, Wen HM
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2019,
Khammash D, Simmonite M, Polk TA, Taylor SF, Meehan SK
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2019,
Schukro C, Puchner SB
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2019,
Gomez-Tames J, Tarnaud T, Miwa K, Hirata A, Van de Steene T, Martens L, Tanghe E, Joseph W
IEEE Trans Electromagn Compat 61 (6): 1944 - 1952
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2019,
Wang Z, Feng Z, Hu H, Yuan Y
2019 41st Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Berlin, Germany. IEEE: S. 6880-6883; ISBN 978-1-5386-1312-2
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2019,
Yu JB, Zhang TZ, Xu DY, Li KY
Zhonghua Kou Qiang Yi Xue Za Zhi 54 (10): 670-675