Die folgenden Begriffe wurden einbezogen:
Mittelwert, "arithmetischer Mittelwert", Mittel, "arithmetic mean", "mean value", mean, 算術平均, 平均値, 平均
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2021,
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2021,
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2021,
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2020,
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2020,
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2020,
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2020,
Bahadir A, Sahin NK, Beyaz R, Yildiz M
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2020,
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2020,
Mustafa BT, Yaba SP, Ismail AH
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J Magn Magn Mater 505: 166726
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2020,
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Appl Sci 10 (10): 3494
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Arch Electr Eng 69 (1): 57-68
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2020,
Yalcin FS, Yalcin Ozdilek S, Altas R
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2020,
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2020,
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2020,
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2020,
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2020,
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2020,
Miclaus S, Bechet P
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2020,
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2020,
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2020,
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2020,
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2020,
Jeevitha G, Anuradha G
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2020,
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2020,
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2020,
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J Burn Care Res 41 (2): 390-397
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2020,
Winter L, Silemek B, Petzold J, Pfeiffer H, Hoffmann W, Seifert F, Ittermann B
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2020,
Cao Z, Yan X, Gore JC, Grissom WA
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2020,
Cordero-Samortin A, Dela Cruz JC, Garcia R, Mabunga Z
2020 IEEE 12th International Conference on Humanoid, Nanotechnology, Information Technology, Communication and Control, Environment, and Management (HNICEM), Manila, Philippines. IEEE: S. 1-6; ISBN 978-1-6654-2997-9
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2020,
Diao Y, Rashed EA, Hirata A
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2020,
Winkler SA, Saniour I, Chaudhari A, Robb F, Vaughan JT
2020 IEEE MTT-S International Microwave Biomedical Conference (IMBioC), Toulouse, France. IEEE: S. 1-3; ISBN 978-1-7281-5867-9
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2020,
Nehra A, Sharma PS, Narain A, Kumar A, Bajpai S, Rajan R, Kumar N, Goyal V, Srivastava AK
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2020,
Deatanyah P, Menyeh A, Amoako JK, Abavare EKK, Osei-Donkor A, Quarshie E
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2020,
Zack F, Schau H, Dalchow A, Rock M, Blaas V, Büttner A
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2020,
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J Cosmet Laser Ther 22 (4-5): 205-209
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2020,
Ranieri F, Mariotto S, Dubbioso R, Di Lazzaro V
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2020,
Salceanu A, Vornicu S, Lunca E, Istrate M
2020 International Conference and Exposition on Electrical And Power Engineering (EPE), Iasi, Romania. IEEE: S. 657-661; ISBN 978-1-7281-8127-1
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2020,
Zvi E, Shemer A, Toussia-Cohen S, Zvi D, Bashan Y, Hirschfeld-Dicker L, Oselka N, Amitai MM, Ezra O, Bar-Yosef O, Katorza E
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2020,
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2020,
Jiang L, Cui H, Zhang C, Cao X, Gu N, Zhu Y, Wang J, Yang Z, Li C
Front Aging Neurosci 12: 593000
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2020,
Mustafa BT, Yaba SP, Ismail AH
Biomed Phys Eng Express 6 (2): 025004
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2020,
Rashmi B, Chinna SK, Rodrigues C, Anjaly D, Bankur PK, Kannaiyan K
Indian J Dent Res 31 (5): 734-737
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Aesthet Surg J 40 (12): NP686-NP693
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2020,
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2020,
Krzyżańska L, Straburzyńska-Lupa A, Rąglewska P, Romanowski L
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2020,
Carlberg M, Koppel T, Hedendahl LK, Hardell L
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2020,
Xue X, Ali YF, Liu C, Hong Z, Luo W, Nie J, Li B, Jiao Y, Liu NA
Int J Mol Sci 21 (23): 9304
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2020,
Wang J, Li M, Zhu D, Cao Y
J Med Internet Res 22 (12): e21923
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2020,
Khubieva VM, Kugusheva NN, Semenova MN
2020 International Multi-Conference on Industrial Engineering and Modern Technologies (FarEastCon), Vladivostok, Russia. IEEE: S. 1-6; ISBN 978-1-7281-6952-1