Die folgenden Begriffe wurden einbezogen:
Feldstärke, "field intensity", "field strength", 電磁界強度
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International Telecommunication Union (ITU),
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2016 IEEE/ACES International Conference on Wireless Information Technology and Systems (ICWITS) and Applied Computational Electromagnetics (ACES), Honolulu, HI, USA. IEEE: 1-4; ISBN 978-1-5090-1259-6
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2016 IEEE International Power Modulator and High Voltage Conference (IPMHVC), San Francisco, CA, USA. IEEE; ISBN 978-1-5090-2355-4
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2016 International Conference on Signal Processing and Communication (ICSC), Noida, India. IEEE; ISBN 978-1-5090-2685-2
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Wenger C, Bomzon Z, Salvador R, Basser PJ, Miranda PC
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: 5664-5667; ISBN 978-1-4577-0220-4
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2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: 5241-5245; ISBN 978-1-4577-0220-4
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2016 National Power Systems Conference (NPSC), Bhubaneswar. IEEE; ISBN 978-1-4673-9969-2
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2016 16th Mediterranean Microwave Symposium (MMS), Abu Dhabi. IEEE; ISBN 978-1-5090-2587-9
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2016 IEEE Global Electromagnetic Compatibility Conference (GEMCCON), Mar del Plata, Argentina. IEEE; ISBN 978-1-5090-4266-1
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2016 International Conference and Exposition on Electrical and Power Engineering (EPE), Iasi, Romania. IEEE; ISBN 978-1-5090-6130-3
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2016 International Conference and Exposition on Electrical and Power Engineering (EPE), Iasi, Romania. IEEE; ISBN 978-1-5090-6130-3
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2016 39th International Conference on Telecommunications and Signal Processing (TSP), Vienna. IEEE: 219-222; ISBN 978-1-5090-1287-9
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Miclaus S, Bechent P, Karpowicz J
2016 International Conference on Applied and Theoretical Electricity (ICATE), Craiova, Romania. IEEE; ISBN 978-1-4673-8562-6
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Iran J Radiol 13 (4): e34016-
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Guo J, Wang Y, Wang J, Zhang J, Fang J
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Lin KW, Yang CJ, Lian HY, Cai P
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Perez F, Millholland G, Peddinti SV, Thella AK, Rizkalla J, Salama P, Rizkalla M, Morisaki J, Rizkalla ME
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J Theor Biol 408: 53-65
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Voloshin T, Munster M, Blatt R, Shteingauz A, Roberts PC, Schmelz EM, Giladi M, Schneiderman RS, Zeevi E, Porat Y, Bomzon Z, Urman N, Itzhaki A, Cahal S, Kirson ED, Weinberg U, Palti Y
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Frelinger 3rd AL, Gerrits AJ, Garner AL, Torres AS, Caiafa A, Morton CA, Berny-Lang MA, Carmichael SL, Neculaes VB, Michelson AD
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Stasinopoulou M, Fragopoulou AF, Stamatakis A, Mantziaras G, Skouroliakou K, Papassideri IS, Stylianopoulou F, Lai H, Kostomitsopoulos N, Margaritis LH
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Alabovsky VV, Kudryshov YB, Vinokurov AA, Bogacheva EV, Maslov OV, Perov SY
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Opitz A, Falchier A, Yan CG, Yeagle EM, Linn GS, Megevand P, Thielscher A, Deborah A R, Milham MP, Mehta AD, Schroeder CE
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Wu SX, Xu YQ, Di GQ, Jiang JH, Xin L, Wu TY
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Matveyenko OA, Komnatnov ME, Busygina AV, Zharkova LP
2016 17th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM), Erlagol. IEEE: 657-660; ISBN 978-1-5090-0787-5
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Buckus R, Strukcinskiene B, Raistenskis J, Stukas R
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