Die folgenden Begriffe wurden einbezogen:
基地局, "Base Transceiver Station", "Sendemast für Mobilfunk", Mobilfunkbasisstation, Mobilfunkantenne, Mobilfunkmast, Basisstation, BTS, "mobile phone relay station", "base station", 携帯電話中継局
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2015,
Baliatsas C, Bolte J, Yzermans J, Kelfkens G, Hooiveld M, Lebret E, van Kamp I
Int J Hyg Environ Health 218 (3): 331-344
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2015,
Eltiti S, Wallace D, Russo R, Fox E
Bioelectromagnetics 36 (2): 96-107
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2015,
Halgamuge MN, Yak SK, Eberhardt JL
Bioelectromagnetics 36 (2): 87-95
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2015,
Dhungel A, Zmirou-Navier D, van Deventer E
Radiat Prot Dosimetry 164 (1-2): 22-27
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2015,
Nicolopoulou EP, Ztoupis IN, Karabetsos E, Gonos IF, Stathopulos IA
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2015,
Kowall B, Breckenkamp J, Berg-Beckhoff G
J Prim Care Community Health 6 (1): 21-28
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2015,
Gandhi G, Kaur G, Nisar U
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2015,
Thielens A, Agneessens S, Verloock L, Tanghe E, Rogier H, Martens L, Joseph W
Radiat Prot Dosimetry 163 (1): 58-69
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2015,
Valic B, Kos B, Gajsek P
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2015,
Beekhuizen J, Kromhout H, Bürgi A, Huss A, Vermeulen R
J Expo Sci Environ Epidemiol 25 (1): 53-57
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2015,
Gerakopoulou P, Matsoukis IL, Giagkou N, Dessypris N, Cassimos DC, Petridou ET
J Health Psychol 20 (8): 1060-1072
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2014,
Giusti G, Licitra G, Lusini D, Silvi AM
2014 International Symposium on Electromagnetic Compatibility, Tokyo, Japan. IEEE: S. 1-5; ISBN 978-4-88552-287-1
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2014,
Cerri G, De Leo R, Russo P, Micheli D
2014 International Symposium on Electromagnetic Compatibility, Tokyo, Japan. IEEE: S. 1-4; ISBN 978-4-88552-287-1
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2014,
Catarinucci L, Palazzari P, Tarricone L
2014 International Symposium on Electromagnetic Compatibility, Tokyo, Japan. IEEE: S. 959-964; ISBN 978-4-88552-287-1
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2014,
Mori F, Sorrentino R, Strappini M, Tarricone L
2014 International Symposium on Electromagnetic Compatibility, Tokyo, Japan. IEEE: S. 1-5; ISBN 978-4-88552-287-1
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2014,
Poljak D, Sarolic A, Roje V
2014 International Symposium on Electromagnetic Compatibility, Tokyo, Japan. IEEE: S. 965-968; ISBN 978-4-88552-287-1
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2014 International Symposium on Electromagnetic Compatibility, Tokyo, Japan. IEEE: S. 1-21; ISBN 978-4-88552-287-1
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2014,
Bit-Babik G, Faraone A
2014 International Symposium on Electromagnetic Compatibility, Tokyo, Japan. IEEE: S. 1-6; ISBN 978-4-88552-287-1
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2014,
Bitz A, Alaydrus M, Streckert J, Hansen VW
2014 International Symposium on Electromagnetic Compatibility, Tokyo, Japan. IEEE: S. 747-750; ISBN 978-4-88552-287-1
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2014,
Ruffilli L, D'Elia S, Barabino A
2014 International Symposium on Electromagnetic Compatibility, Tokyo, Japan. IEEE: S. 1-6; ISBN 978-4-88552-287-1
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2014,
Flintoft ID, Porter SJ, Capstick MH, Marvin AC
2014 International Symposium on Electromagnetic Compatibility, Tokyo, Japan. IEEE: S. 1-6; ISBN 978-4-88552-287-1
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2014,
Herschlein A, Baldauf M, Sörgel W, Wiesbeck W
2014 International Symposium on Electromagnetic Compatibility, Tokyo, Japan. IEEE: S. 1-4; ISBN 978-4-88552-287-1
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2014,
Bernardi P, Cavagnaro M, Pisa S, Piuzzi E
2014 International Symposium on Electromagnetic Compatibility, Tokyo, Japan. IEEE: S. 1-5; ISBN 978-4-88552-287-1
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2014,
Pachuau L, Pachuau Z
IOSR Journal of Applied Physics 6 (1 Ver.1): 1-6
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2014,
Felix OK, Gabriel AU, Emmanuel AC
JEE 5 (1): 46-60