Die folgenden Begriffe wurden einbezogen:
"berufliche Exposition", "occupational exposure", 職業ばく露
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2020,
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2020,
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J Occup Health 62 (1): e12136
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2020,
Carlberg M, Koppel T, Ahonen M, Hardell L
Environ Res 189: 109806
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2020 5th Asia Conference on Power and Electrical Engineering (ACPEE), Chengdu, China. IEEE: S. 1756-1761; ISBN 978-1-7281-5282-0
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2020,
Mishulin A, Arsenault S, Glybina I, Tomsak RL
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2020,
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J Environ Sci Health A Tox Hazard Subst Environ Eng 55 (10): 1141-1148
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2020 Ural Symposium on Biomedical Engineering, Radioelectronics and Information Technology (USBEREIT), Yekaterinburg, Russia. IEEE: S. 147-151; ISBN 978-1-7281-3166-5
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2020,
Jamal T, Shalabi A, Grosman-Rimon L, Ghanim D, Amir O, Kachel E
J Cardiothorac Surg 15 (1): 143
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2020,
Dickerson AS, Wu AC, Liew Z, Weisskopf M
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Ann Work Expo Health 64 (8): 838-851
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2020,
Jingo K, Kondo Y, Hirano Y, Inoue J, Kawasaki T, Miyoshi Y, Ishihara T, Okamoto K, Tanaka H
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2020,
Liu S, Zheng J, Zheng Q
J Burn Care Res 41 (5): 1118-1121
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2020,
Carlberg M, Koppel T, Ahonen M, Hardell L
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IEEE Trans Ind Appl 56 (4): 4319-4323
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2020,
Lubner RJ, Kondamuri NS, Knoll RM, Ward BK, Littlefield PD, Rodgers D, Abdullah KG, Remenschneider AK, Kozin ED
Front Neurol 11: 234
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2020,
Aris A, Yiannis K, Charilaos T, Alkhorayef M, Sulieman A, Ioannis T, Kiki T, Constantin K
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2020,
Filippini T, Tesauro M, Fiore M, Malagoli C, Consonni M, Violi F, Iacuzio L, Arcolin E, Oliveri Conti G, Cristaldi A, Zuccarello P, Zucchi E, Mazzini L, Pisano F, Gagliardi I, Patti F, Mandrioli J, Ferrante M, Vinceti M
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2020,
Boudier-Revéret M, Hsiao MY, Shyu SG, Chang MC
BMC Neurol 20: 130
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2020,
Stege TAM, Bolte JFB, Claassen L, Timmermans DRM
J Risk Res 23 (12): 1650-1660
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2020,
Carles C, Esquirol Y, Turuban M, Piel C, Migault L, Pouchieu C, Bouvier G, Fabbro-Peray P, Lebailly P, Baldi I
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2020,
Bottauscio O, Arduino A, Bavastro D, Capra D, Guarneri A, Parizia AA, Zilberti L
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2020,
International Commission on Non-Ionizing Radiation Protection (ICNIRP)
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2020,
Bagheri Hosseinabadi M, Khanjani N, Atashi A, Norouzi P, Mirbadie SR, Mirzaii M
Mutat Res Genet Toxicol Environ Mutagen 850–851: 503150
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2020,
Tlyauberdina AS, Antipin BM, Vinogradov EM
2020 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus), St. Petersburg and Moscow, Russia. IEEE: S. 1626-1628; ISBN 978-1-7281-5762-7
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2020,
Hosseinabadi MB, Khanjani N, Norouzi P, Mirzaii M, Biganeh J, Nazarkhani F
Toxicol Ind Health 36 (2): 99-109
