Die folgenden Begriffe wurden einbezogen:
"Spezifische Absorptionsrate", SAR, "specific energy absorption rate", "specific absorption rate", 比エネルギー吸収率, 比吸収率
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2021,
Martinez JA, Cork TE, Chubb H, Vasanawala S, Ennis DB
2021 43rd Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC), Mexico. IEEE: S. 5027-5030; ISBN 978-1-7281-1180-3
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2021,
Tanrıverdi V, Gençer NG
[2021 Medical Technologies Congress (TIPTEKNO)], Antalya, Turkey. IEEE: S. 1-4; ISBN 978-1-6654-3663-2
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2021,
Bonato M, Dossi L, Chiaramello E, Benini M, Gallucci S, Fiocchi S, Tognola G, Parazzini M
2021 43rd Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC), Mexico. IEEE: S. 595-599; ISBN 978-1-7281-1179-7
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2021,
Zheng C, Chen X, Nguyen BT, Sanpitak P, Vu J, Bagci U, Golestanirad L
2021 43rd Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC), Mexico. IEEE: S. 4204-4208; ISBN 978-1-7281-1179-7
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2021,
Islam R, Mahbub F, Al-Nahiun SAK, Rabbi MIH
2021 IEEE 12th Annual Information Technology, Electronics and Mobile Communication Conference (IEMCON), Vancouver, BC, Canada. IEEE: S. 1040-1045; ISBN 978-1-6654-0067-1
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2021,
Saeed A, Ejaz A, Amin Y
2021 International Conference on Computing, Electronic and Electrical Engineering (ICE Cube), Quetta, Pakistan. IEEE: S. 1-5; ISBN 978-1-6654-0155-5
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2021,
Li Y, Deng P, Chen C, Ma Q, Pi H, He M, Lu Y, Gao P, Zhou C, He Z, Zhang Y, Yu Z, Zhang L
Front Public Health 9: 771508
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2021,
Derat B, Celik M, Colombi D, Xu B, Törnevik C, Schaefer D, Simon W
2021 Antenna Measurement Techniques Association Symposium (AMTA), Daytona Beach, FL, USA. IEEE: S. 1-6; ISBN 978-1-6654-4515-3
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2021,
Afaghi P, Lapolla MA, Ghandi K
Sci Rep 11: 23373
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2021,
Liu K, Zheng H, Liu R, Cui W
2021 International Conference on Microwave and Millimeter Wave Technology (ICMMT), Nanjing, China. IEEE: S. 1-3; ISBN 978-1-6654-3438-6
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2021,
Feng Y, Li Z, Chen P, Li G
2021 International Conference on Microwave and Millimeter Wave Technology (ICMMT), Nanjing, China. IEEE: S. 1-3; ISBN 978-1-6654-3438-6
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2021,
Arulmurugan S, Sureshkumar TR, Alex ZC
2021 Emerging Trends in Industry 4.0 (ETI 4.0), Raigarh, India. IEEE: S. 1-5; ISBN 978-1-6654-4663-1
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2021,
Soares N, Fernández-Rodríguez C, Bulla G, de Salles AA
2021 SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference (IMOC), Fortaleza, Brazil. IEEE: S. 1-3; ISBN 978-1-6654-4016-5
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2021,
Govindan T, Palaniswamy SK, Kanagasabai M, Kumar S, Rao TR, Kannappan L
2021 IEEE International Conference on RFID Technology and Applications (RFID-TA), Delhi, India. IEEE: S. 199-202; ISBN 978-1-6654-2658-9
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2021,
Liu XZ, Yu G, Chao J, Zhang HH, Liu Y
2021 International Conference on Microwave and Millimeter Wave Technology (ICMMT), Nanjing, China. IEEE: S. 1-3; ISBN 978-1-6654-3438-6
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2021,
Karim ME, Aowlad Hossain ABM
2021 Fourth International Conference on Electrical, Computer and Communication Technologies (ICECCT), Erode, India. IEEE: S. 1-5; ISBN 978-1-6654-4751-5
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2021,
Islam H, Das S, Bose T, Dhar S
Int J Microw Wirel Technol 13 (10): 1103-1108
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2021,
Spandana PS, Jayasree PVY
Prog Electromagn Res M 105: 31-44
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2021,
Sun H, Hou S, Zhao Y, Yan W, Wu Y
Appl Comput Electromagn Soc J 36 (10): 1355-1366
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Prog Electromagn Res M 105: 151-160
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2021 International Symposium on Antennas and Propagation (ISAP), Taipei, Taiwan. IEEE: S. 1-2; ISBN 978-1-6654-3113-2
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2021 International Symposium on Networks, Computers and Communications (ISNCC), Dubai, United Arab Emirates. IEEE: S. 1-4; ISBN 978-1-6654-4829-1
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2021,
Ahmad S, Paracha KN, Sheikh YA, Ghaffar A, Butt AD, Alibakhshikenari M, Soh PJ, Khan S, Falcone F
IEEE Access 9: 159598-159615
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2021,
Mahbub F, Islam R, Ali MT, Rahman MA
2021 IEEE Microwave Theory and Techniques in Wireless Communications (MTTW), Riga, Latvia. IEEE: S. 263-268; ISBN 978-1-6654-2470-7
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2021,
Jovanović DB, Jovanović DB, Stanković VB, Živaljević DU, Cvetković NN, Vučković DD, Hederić ZD
2021 15th International Conference on Advanced Technologies, Systems and Services in Telecommunications (TELSIKS), Nis, Serbia. IEEE: S. 157-160; ISBN 978-1-6654-4443-9