Die folgenden Begriffe wurden einbezogen:
"Institute of Electrical and Electronics Engineers", IEEE, 米国電気電子学会
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2018,
Tarnaud T, Tanghe E, Haesler S, Lopez CM, Martens L, Joseph W
2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: S. 2166-2169; ISBN 978-1-5386-3647-3
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2018,
Hao D, Zhou Y, Gao P, Yang L, Yang Y, Chen F
2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: S. 2174-2177; ISBN 978-1-5386-3647-3
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2018,
Shah AA, Alonso F, Vogel D, Wardell K, Coste J, Lemaire JJ, Pison D, Hemm S
2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: S. 2222-2225; ISBN 978-1-5386-3647-3
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2018,
Zaeimbashi M, Wang Z, Lee SW, Cash S, Fried S, Sun N
2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: S. 2230-2233; ISBN 978-1-5386-3647-3
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2018,
Al-Kaysi AM, Al-Ani A, Galvez V, Colleen Loo K, Ling S, Tjeerd Boonstra W
2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: S. 3677-3680; ISBN 978-1-5386-3647-3
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2018,
Wang L, Yang J, Wang F, Zhou P, Wang K, Ming D
2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: S. 259-262; ISBN 978-1-5386-3647-3
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2018,
Asan AS, Gok S, Sahin M
2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: S. 2252-2255; ISBN 978-1-5386-3647-3
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2018,
Im C, Seo H, Jun SC
2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: S. 3092-3095; ISBN 978-1-5386-3647-3
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2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: S. 4764-4767; ISBN 978-1-5386-3647-3
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2018,
Arima T, Murakami Y, Uno T
2018 IEEE Conference on Antenna Measurements & Applications (CAMA), Västerås, Sweden. IEEE: S. 1-2; ISBN 978-1-5386-5796-6