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2023,
Kodera S, Miura N, Diao Y, Inoue M, Hikage T, Taguchi K, Masuda H, Hirata A
IEEE J Electromagn RF Microw Med Biol 7 (1): 65-72
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2022,
Elshirkasi AM, Al-Hadi AA, Khan R, Prayoot Akkaraekthalin, Abdelmula HSB, Belghasem AM, Jebril AH, Soh PJ
IEEE Access 10: 2083-2096
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2022,
Parchin NO, Amar ASI, Darwish M, Moussa KH, See CH, Abd-Alhameed RA, Alwadai NM, Mohamed HG
IEEE Access 10: 133037-133051
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2022,
Nguyen KT, Van CN, Nguyen KK, Ta SX, Dao-Ngoc C
2022 IEEE Ninth International Conference on Communications and Electronics (ICCE), Nha Trang, Vietnam. IEEE: S. 273-277; ISBN 978-1-6654-9746-6
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2022,
Occhiuzzi C, Venturi FR, Amato F, Di Carlofelice A, Tognolatti P, Marrocco G
IEEE J Radio Freq Identif 6: 629-636
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2022,
Wane S, Dinh TV, Tran QH, Bajon D, Ferrero F, Duvillaret L, Gaborit G, Sombrin J, de Lédinghen E, Laban P, Huard V, Mhira S, Tombakdjian L, Ratajczak P, Bousseksou A
2022 IEEE Radio and Wireless Symposium (RWS), Las Vegas, NV, USA. IEEE: S. 68-71; ISBN 978-1-6654-3463-8
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2022,
Ibrahim A, Tetik E, Karamzadeh S
2022 30th Signal Processing and Communications Applications Conference (SIU), Safranbolu, Turkey. IEEE: S. 1-4; ISBN 978-1-6654-5093-5
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2022 IEEE 22nd International Conference on Communication Technology (ICCT), Nanjing, China. IEEE: S. 706-711; ISBN 978-1-6654-7068-1
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2022,
Gökdemir M, Saeidi T, Karamzadeh S, Akleman F
2022 30th Signal Processing and Communications Applications Conference (SIU), Safranbolu, Turkey. IEEE: S. 1-4; ISBN 978-1-6654-5093-5
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2022,
Ali K, Cosmas J, Zhang Y, Zhang H, Meunier B, Jawad N, Zhang X, Shi L, Gbadamosi J, Savov A
IEEE Trans Broadcast 68 (1): 156-170
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2022,
Ursăchianu MV, Lăzărescu C, Bejenaru O, Sălceanu A
IOP Conf Ser Mater Sci Eng 1254: 012026
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2022,
Mishra P, Jain P, Singh MP, Ghosh S
2022 URSI Regional Conference on Radio Science (USRI-RCRS), Indore, India. IEEE: S. 1-4; ISBN 978-1-6654-5359-2
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2022,
Jain A, Mishra A, Dubey SK
2022 URSI Regional Conference on Radio Science (USRI-RCRS), Indore, India. IEEE: S. 1-4; ISBN 978-1-6654-5359-2
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2022,
Ibrahim A, Razali AR, Jusoh M, Faudzi NM, Mozi AM
2022 IEEE International RF and Microwave Conference (RFM), Kuala Lumpur, Malaysia. IEEE: S. 1-4; ISBN 978-1-6654-8978-2
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2022,
Ben Saada A, Ben Mbarek S, Choubani F
Barolli L, Hussain F, Enokido T (Hrsg.): Advanced Information Networking and Applications. Lecture Notes in Networks and Systems, Band 449; Springer, Cham; S. 471-478; ISBN 978-3-030-99583-6
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2022,
Jeladze V, Shoshiashvili L, Partsvania B
2022 IEEE 2nd Ukrainian Microwave Week (UkrMW), Ukraine. IEEE: S. 477-481; ISBN 9798350331530
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2022,
Derat B, Celik M, Wittmann M, El Hajj W, Colombi D
2022 Antenna Measurement Techniques Association Symposium (AMTA), Denver, CO, USA. IEEE: S. 1-6; ISBN 978-1-6654-8427-5
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2022,
Miclaus S, Deaconescu DB, Vatamanu D, Buda AM
2022 International Symposium on Electronics and Telecommunications (ISETC), Timisoara, Romania. IEEE: S. 1-4; ISBN 978-1-6654-5151-2
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2022,
Miura N, Kodera S, Higashiyama J, Iyama T, Suzuki Y, Hirata A
2022 Asia-Pacific Microwave Conference (APMC), Yokohama, Japan. IEEE: S. 423-425; ISBN 978-1-6654-5108-6
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2022,
Ahumada C, Kaschel H, Cordero S, Osorio-Comparan R
2022 IEEE International Conference on Automation/XXV Congress of the Chilean Association of Automatic Control (ICA-ACCA), Curicó, Chile. IEEE: S. 1-5; ISBN 978-1-6654-9409-0
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2022,
Gallucci S, Bonato M, Benini M, Chiaramello E, Fiocchi S, Tognola G, Parazzini M
Sensors 23 (1): 104
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2022,
Luo S, Wang Z, Wang H, Chen S
2022 6th International Conference on Communication and Information Systems (ICCIS), Chongqing, China. IEEE: S. 27-34; ISBN 978-1-6654-6386-7
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2022 6th International Conference on Communication and Information Systems (ICCIS), Chongqing, China. IEEE: S. 1-6; ISBN 978-1-6654-6386-7
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2022,
Sekiya K, Ishii N, Shimizu Y, Nagaoka T
2022 IEEE International Workshop on Electromagnetics: Applications and Student Innovation Competition (iWEM), Narashino, Japan. IEEE: S. 79-80; ISBN 978-1-6654-3239-9
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2022,
Yamamoto K, Hikage T, Masuda H, Ishitake T, Li K, Nagai A
2022 IEEE International Workshop on Electromagnetics: Applications and Student Innovation Competition (iWEM), Narashino, Japan. IEEE: S. 37-38; ISBN 978-1-6654-3239-9