Studienübersichten

• 2021, Wood A, Mate R, Karipidis K
  [Details] Meta-analysis of in vitro and in vivo studies of the biological effects of low-level millimetre waves [Review]
  J Expo Sci Environ Epidemiol 31 (4): 606-613
• 2021, Singh A, Rehman SU, Yongchareon S, Chong PHJ
  Multi-Resident Non-Contact Vital Sign Monitoring Using Radar: A Review [Review]
  IEEE Sens J 21 (4): 4061-4084
• 2021, Kaur S, Chandel S, Singh HP, Batish DR, Kohli RK, Vian A
  [Details] Sensitivity of plants to high frequency electromagnetic radiation: cellular mechanisms and morphological changes [Review]
  Rev Environ Sci Biotechnol 20: 55–74
• 2021, Dilli R
  [Details] Implications of mmWave Radiation on Human Health: State of the Art Threshold Levels [Review]
  IEEE Access 9: 13009-13021
• 2021, Blažek P, O'Connor MJ, Weigand S, Grebmer C, Reif S, Fichtner S, Friedrich L, Reents T, Kottmaier M, Semmler V, Bourier F, Schunkert H, Deisenhofer I, Kolb C, Lennerz C
  Security millimetre wave body scanner safe for patients with leadless pacemakers or subcutaneous implantable cardioverter-defibrillators [Gerät/Impl.]
  J Interv Card Electrophysiol 61 (3): 603-607
• 2020, Lin JC
  5G Communication Technology and Coronavirus Disease [Kommentar]
  IEEE Microw Mag 21 (9): 16-19
• 2020, Health Council of the Netherlands
  [Details] Background document to the advisory report 5G and health [Info]
  The Hague: Health Council of the Netherlands, publication no. 2020/16Ae: 1-131
• 2020, Fioranelli M, Sepehri A, Roccia MG, Jafferany M, Olisova OY, Lomonosov KM, Lotti T
  RETRACTED: 5G Technology and induction of coronavirus in skin cells [Kommentar]
  J Biol Regul Homeost Agents 34 (4)
• 2020, Health Council of the Netherlands
  5G and health [Info]
  The Hague: Health Council of the Netherlands, publication no. 2020/16e: 1-33
• 2020, Hirata A, Kodera S
  Difference of ICNIRP Guidelines and IEEE C95.1 Standard for Human Protection from Radio-Frequency Exposures [Grundlagen]
  2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: S. 1-5; ISBN 978-1-7281-5580-7