キーワード:
電圧, "Elektrische Spannung", Spannung, "electric voltage", voltage
-
2017,
Sen S, Chakraborty M, Goley S, Dasgupta S, Dasgupta S
Biophys Chem 226: 23-33
-
2017,
Hundeshagen G, Wurzer P, Forbes AA, Voigt CD, Collins VN, Cambiaso-Daniel J, Finnerty CC, Herndon DN, Branski LK
J Trauma Acute Care Surg 82 (5): 946-951
-
2017,
Pakhomov AG, Semenov I, Casciola M, Xiao S
Biochim Biophys Acta Biomembr 1859 (7): 1273-1281
-
2017,
Sadeghi T, Ahmadi A, Javadian M, Gholamian SA, Delavar MA, Esmailzadeh S, Ahmadi B, Hadighi MSH
Rom J Intern Med 55 (3): 145-150
-
2017,
Petri AK, Schmiedchen K, Stunder D, Dechent D, Kraus T, Bailey WH, Driessen S
Environ Health 16: 41
-
Pediatr Ann 46 (4): e172-e174
-
2017,
Argus F, Boyd B, Becker SM
Comput Biol Med 84: 226-234
-
2017,
Grassner L, Bierschneider M, Strowitzki M, Grillhösl A
Burns 43 (4): e7-e10
-
2017,
Sen R, Sarkar AK, Sarker PC, Paul LC, Rashid MMU
2017 IEEE International Conference on Imaging, Vision & Pattern Recognition (icIVPR), Dhaka, Bangladesh. IEEE; ISBN 978-1-5090-6004-7
-
2017,
Burke M, Odell M, Bouwer H, Murdoch A
[詳細]
[電気フェンスと死亡事故]
[elec. inj.]
Forensic Sci Med Pathol 13: 196-208
-
2017,
Porsius JT, Claassen L, Woudenberg F, Smid T, Timmermans DRM
Risk Anal 37 (12): 2276-2288
-
2017,
Choong M, Chy D, Guevarra JR, Ross AG
BMJ Case Rep 2017
-
2017,
Russo RJ, Costa HS, Silva PD, Anderson JL, Arshad A, Biederman RW, Boyle NG, Frabizzio JV, Birgersdotter-Green U, Higgins SL, Lampert R, Machado CE, Martin ET, Rivard AL, Rubenstein JC, Schaerf RH, Schwartz JD, Shah DJ, Tomassoni GF, Tominaga GT, Tonkin AE, Uretsky S, Wolff SD
N Engl J Med 376 (8): 755-764
-
2017,
Bellono NW, Leitch DB, Julius D
Nature 543 (7645): 391-396
-
2017,
Romanchenko IV, Rostov VV, Gunin AV, Konev VY
Rev Sci Instrum 88 (2): 024703
-
2017,
Hori T, Inoue N, Suzuki H, Harakawa S
Bioelectromagnetics 38 (4): 265-271
-
2017,
Huang RY, Liao CC, Tsai SY, Yen CT, Lin CW, Chen TC, Lin WT, Chang CH, Wen YR
Pain Physician 20 (2): E269-E283
-
2017,
Harakawa S, Hori T, Inoue N, Suzuki H
Bioelectromagnetics 38 (4): 272-279
-
2017,
Xiao C, Wei K, Cheng D, Liu Y
IEEE Trans Ind Electron 64 (5): 3978-3988
-
2017,
Li Y, Xu T, Chen X, Lin S, Cho M, Sun D, Yang M
Anal Bioanal Chem 409 (8): 2163-2178
-
2017,
Deng D, Yuan H, Lv J, Ju Y
PLoS One 12 (1): e0169034
-
2017,
Xavier P, Rauly D, Chamberod E, Martins JM
Bioelectromagnetics 38 (3): 213-219
-
2017,
Zheng Y, Dou JR, Gao Y, Dong L, Li G
Int J Radiat Biol 93 (4): 449-455
-
2017,
Altaf E, Mitchel EK, Berry C, Hossain A
[詳細]
[肺胞蛋白症による死亡]
[elec. inj.]
Am J Forensic Med Pathol 38 (1): 11-13
-
2017,
Mi Y, Rui S, Li C, Yao C, Xu J, Bian C, Tang X
Med Biol Eng Comput 55 (7): 1109-1122
-
2017,
Mukesh S, Blake DT, McKinnon BJ, Bhatti PT
IEEE Trans Neural Syst Rehabil Eng 25 (8): 1353 - 1362
-
2017,
Freschi F, Giaccone L, Mitolo M
IEEE Trans Ind Appl 53 (2): 819-825
-
2017,
Magne I, Souques M, Bureau I, Duburcq A, Remy E, Lambrozo J
J Expo Sci Environ Epidemiol 27 (5): 505-512
-
2017,
Vila J, Bowman JD, Figuerola J, Moriña D, Kincl L, Richardson L, Cardis E
J Expo Sci Environ Epidemiol 27 (4): 398-408
-
2017,
Karamanli H, Akgedik R
[詳細]
[低電圧電撃傷による肺の損傷]
[elec. inj.]
Acta Clin Belg 72 (5): 349-351
-
Biotechnol Prog 33 (1): 5-16
-
2017,
Xu G, Su R, Lv J, Lai X, Li X, Wu J, Hu B, Xu L, Shen R, Gu J, Yu X
Int J Legal Med 131 (2): 433-439
-
2017,
Sokhal AK, Lodha KG, Kumari M, Paliwal R, Gothwal S
Burns 43 (1): 182-189
-
2017,
Milham S, Stetzer D
Electromagn Biol Med 36 (2): 149-153
-
2017,
Karimi H, Akhoondinasab MR, Kazem-Zadeh J, Dayani AR
J Burn Care Res 38 (2): e568-e573
-
2017,
Tang SC, Lun TLT, Guo Z, Kwok KW, McDannold N
IEEE Transactions on Power Electronics 32 (5): 3844 - 3857
-
2017,
Shih JG, Shahrokhi S, Jeschke MG
J Burn Care Res 38 (1): e293-e298
-
2017,
Xiao S, Semenov I, Petrella R, Pakhomov AG, Schoenbach KH
Med Biol Eng Comput 55 (7): 1063-1072
-
2017,
Seckler T, Stunder D, Schikowsky C, Joosten S, Zink MD, Kraus T, Marx N, Napp A
Europace 19 (2): 319-328
-
2017,
Claassen L, van Dongen D, Timmermans DRM
J Risk Res 20 (9): 115-1131
-
2016,
Canova A, Freschi F, Giaccone L
2016 IEEE Industry Applications Society Annual Meeting, Portland, OR, USA. IEEE: 1-7; ISBN 978-1-4799-8398-8
-
2016,
Kanemaki M, Shimizu HO, Kitama M, Yamashita M, Miura H, Shimizu K
2016 Progress in Electromagnetic Research Symposium (PIERS), Shanghai, China. IEEE: 1115-1118; ISBN 978-1-5090-6094-8
-
2016,
Jiang S, Zhang X, Yuan Z, Wu X
2016 Progress in Electromagnetic Research Symposium (PIERS), Shanghai, China. IEEE: 5199-5205; ISBN 978-1-5090-6094-8
-
2016,
Frezzi P, Hug R, Grant J, Klingler A
2016 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Wroclaw, Poland. IEEE: 876-881; ISBN 978-1-5090-1417-0
-
2016,
Lisitsyna LI, Belavskaya SV, Pedonova ZN, Kuzmin AN, Poteryaeva EL, Lyutkevich AA, Feofilov IV
2016 13th International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE), Novosibirsk, Russia. IEEE: 402-408
-
2016,
Rachedi BA, Babouri A, Xun Z
Rev Roum Sci Techn – Électrotechn et Énerg 61 (2): 178-182
-
Hum Ecol Risk Assess 22 (8): 1696-1707
-
German Commission for Electrical, Electronic & Information Technologies of DIN and VDE (DKE),
DIN EN 61140 VDE 0140-1:2016-11
-
Molecular Physics 114 (11): 1691-1702
-
2016,
Kim SC, Mason A, Im W
J Vis Exp (113)