Die folgenden Begriffe wurden einbezogen:
t-Test, "Student's t-test", スチューデントt-検定, t-検定
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2023,
Zhou X, Dou L, Huang H, Shen Q, Zhou X, Li A, Tang W, Pang X, Zhang Y, Wu T
2023 IEEE 7th International Symposium on Electromagnetic Compatibility (ISEMC), Hangzhou, China. IEEE: S. 1-5; ISBN 9798350333114
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2023,
Xinhua P, Xin Z, Huixiong H, Qingfei S, Anxiang L, Wei T, Chao Y, Tong W
2023 IEEE 7th International Symposium on Electromagnetic Compatibility (ISEMC), Hangzhou, China. IEEE: S. 1-5; ISBN 9798350333114
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2023 IEEE 7th International Symposium on Electromagnetic Compatibility (ISEMC), Hangzhou, China. IEEE: S. 1-4; ISBN 9798350333114
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2023,
Li C, Sha S, Zhao H, Xing L, Xu Q
2023 IEEE 7th International Symposium on Electromagnetic Compatibility (ISEMC), Hangzhou, China. IEEE: S. 1-3; ISBN 9798350333114
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2023,
Sciurba FC, Dransfield MT, Kim V, Marchetti N, Comellas A, Hogarth DK, Majid A
BMJ Open Respir Res 10 (1): e001710
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2023,
Nowak-Terpiłowska A, Górski R, Marszałek M, Wosiński S, Przesmycki R, Bugaj M, Nowosielski L, Baranowski M, Zeyland J
Ann Agric Environ Med 30 (4): 763-772
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2023,
Lodi MB, Makridis A, Kazeli K, Samaras T, Angelakeris M, Muntoni G, Fanti A, Mazzarella G
2023 24th International Conference on Applied Electromagnetics and Communications (ICECOM), Dubrovnik, Croatia. IEEE: S. 1-4; ISBN 9798350313024
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2023,
Dongge Z, Rui M, Li H, Jiangbo S, Jizhong F
2023 IEEE 5th International Conference on Civil Aviation Safety and Information Technology (ICCASIT), Dali, China. IEEE: S. 1297-1303; ISBN 9798350310610
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2023,
Nguyen TXD, Kuo CW, Peng CW, Liu HL, Chang MY, Hsieh TH
Front Neurosci 17: 1303014
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2023,
Rajendran R, Venkatachalapathy S, Thiyagarajan B, Jeevagan S, Chinnasamy A, Sivanandham M
J Contemp Dent Pract 24 (5): 303-307