Die folgenden Begriffe wurden einbezogen:
t-Test, "Student's t-test", スチューデントt-検定, t-検定
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2022,
Asok AO, Vidhya JS, Babu FB, Dey S, Kunju N
2022 IEEE 19th India Council International Conference (INDICON), Kochi, India. IEEE: S. 1-4; ISBN 978-1-6654-5272-4
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2022,
Liu Z, Hao W, Huang R
2022 IEEE Conference on Telecommunications, Optics and Computer Science (TOCS), Dalian, China. IEEE: S. 1157-1162; ISBN 978-1-6654-7054-4
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2022,
Nozadze T, Henke K, Kurtsikidze M, Jeladze V, Ghvedashvili G, Zaridze R
2022 IEEE 2nd Ukrainian Microwave Week (UkrMW), Ukraine. IEEE: S. 439-443; ISBN 9798350331530
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2022,
Derat B, Celik M, Wittmann M, El Hajj W, Colombi D
2022 Antenna Measurement Techniques Association Symposium (AMTA), Denver, CO, USA. IEEE: S. 1-6; ISBN 978-1-6654-8427-5
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2022,
Schaefer LV, Bittmann FN
Front Med 9: 879971
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2022,
Cresci A, Durif CMF, Larsen T, Bjelland R, Skiftesvik AB, Browman HI
PNAS Nexus 1 (4): pgac175
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2022,
Yucel H, Dundar NO, Doguc DK, Uguz C, Celik O, Aksoy FT, Naziroglu M, Comlekci S, Dundar B
Int J Radiat Res 20 (4): 753-760
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2022,
Aeen MP, Mahdavi SM, Maghami P, Modarresi Chahardehi A
Act Nerv Super Rediviva 64 (2-3): 77-85
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2022,
Pustake S, Upadhyaya V, Bundele M
2022 IEEE Pune Section International Conference (PuneCon), Pune, India. IEEE: S. 1-7; ISBN 978-1-6654-9898-2
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2022,
Shimizu Y, Ishii N, Nagaoka T
2022 Asia-Pacific Microwave Conference (APMC), Yokohama, Japan. IEEE: S. 133-135; ISBN 978-1-6654-5108-6
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2022,
Szychta L, Jankowski-Mihułowicz P, Szychta E, Olszewski K, Putynkowski G, Barczak T, Wasilewski P
Energies 15 (24): 9342
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2022,
Riddle J, Scimeca JM, Pagnotta MF, Inglis B, Sheltraw D, Muse-Fisher C, D'Esposito M
Front Hum Neurosci 16: 1050605
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2022,
Asha Banu SM, Niresh Kumar K, Mohamed Faizal M, Murugananda Sri Sabari Vasan S
2022 4th International Conference on Inventive Research in Computing Applications (ICIRCA), Coimbatore, India. IEEE: S. 1-8; ISBN 978-1-6654-9708-4
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J Comput Methods Sci Eng 22 (6): 2257-2266
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2022,
Nishikawa T, Hikage T, Yamamoto M
2022 IEEE International Workshop on Electromagnetics: Applications and Student Innovation Competition (iWEM), Narashino, Japan. IEEE: S. 124-125; ISBN 978-1-6654-3239-9
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2022,
Sekiya K, Ishii N, Shimizu Y, Nagaoka T
2022 IEEE International Workshop on Electromagnetics: Applications and Student Innovation Competition (iWEM), Narashino, Japan. IEEE: S. 79-80; ISBN 978-1-6654-3239-9
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2022,
Cambiaghi M, Infortuna C, Gualano F, Elsamadisi A, Malik W, Buffelli M, Han Z, Solhkhah R, Thomas FP, Battaglia F
Front Cell Neurosci 16: 1082211
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2022,
Zhang J, Du C, Wang R
Micromachines 13 (12): 2141
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2022,
Hecht C, Figgener J, Sauer DU
iScience 25 (12): 105634
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2022,
González-Isaza P, Sánchez-Borrego R, Lugo Salcedo F, Rodríguez N, Vélez Rizo D, Fusco I, Callarelli S
Medicina 58 (12): 1721
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2022,
Xiang XN, Zhu SY, Song KP, Wang XY, Liu HZ, Yang WJ, Wang H, Zhang C, Yang L, He C
BMJ Open 12 (9): e060350
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2022,
Qu X, Wang Z, Cheng Y, Xue Q, Li Z, Li L, Feng L, Hartwigsen G, Chen L
Front Hum Neurosci 16: 1027446
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Front Psychiatry 13: 1038312
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2022,
Brito RC, Olivato T, Kitabatake TT, Zhang K, de Oliveira Guirro EC, de Araujo JE
Neurosci Lett 794: 137013
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2022,
Beard BB, Iacono MI, Guag JW, Liu Y
IEEE Electromagn Compat Mag 11 (3): 49-54