Die folgenden Begriffe wurden einbezogen:
t-Test, "Student's t-test", スチューデントt-検定, t-検定
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2023,
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2023,
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2023,
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2022,
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2022,
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2022,
Wang Y, Hu H, Shang H, Peng T
2022 IEEE 3rd China International Youth Conference on Electrical Engineering (CIYCEE), Wuhan, China. IEEE: S. 1-5; ISBN 978-1-6654-7733-8
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2022,
Li H, Du J, Yang XX, Gao S
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2022,
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2022,
Dömötör Z, Köteles F, Szemersky R
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2022,
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2022,
Mukherjee D, Rainu S, Singh N, Mallick D
2022 IEEE Biomedical Circuits and Systems Conference (BioCAS), Taipei, Taiwan. IEEE: S. 505-509; ISBN 978-1-6654-6918-0
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2022,
Lu M, Sengupta S, Gore JC, Grissom WA, Yan X
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Institute of Electrical and Electronics Engineers (IEEE),
IEEE Std 149-2021 (Revision of IEEE Std 149-1977): 1-550, ISBN 9798855711875
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2022,
Li C, Sharawi MS, Mittra R
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2022,
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2022,
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