Die folgenden Begriffe wurden einbezogen:
t-Test, "Student's t-test", スチューデントt-検定, t-検定
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2024,
Anwar U, Arslan T, Lomax P
2024 46th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: S. 1-5; ISBN 9798350371505
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2024,
Vivarelli C, Mattei E, Censi F, Calcagnini G, Freschi F, Giaccone L, Canova A
2024 46th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: S. 1-4; ISBN 9798350371505
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2024,
Ishikawa Y, Oishi N, Kyuragi Y, Hatakoshi M, Hirano J, Noda T, Yoshihara Y, Ito Y, Miyata J, Nemoto K, Fujita Y, Igarashi H, Takahashi K, Murakami S, Kanno H, Izumi Y, Takamiya A, Matsumoto J, Kodaka F, Nakagome K, Mimura M, Murai T, Suwa T
Mol Psychiatry [im Druck]
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2024,
Feng X, Zhao X, Zhou R, Chen L, Chen G, Zhu T, Ye L
Pain Physician 27 (10): E1073-E1083
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2024,
Wang LL, Wan HY, Xing M, Su YS, Zhang ZY, Liu XY, Jing XH
Zhen Ci Yan Jiu 49 (12): 1231-1238
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2024,
Jeong H, Guag JW, Kumar A
IEEE Access [im Druck]
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2024,
Wang Y, Zeng GQ, Wang M, Zhang M, Chang C, Liu Q, Wang K, Ma R, Wang Y, Zhang X
Front Hum Neurosci 18: 1484593
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2024,
Raju S, Kularatna N, Wilson MT, Steyn Ross A
Biomed Phys Eng Express [im Druck]
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2024,
Demirdogen F, Akcay G
Pflugers Arch [im Druck]
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2024,
Li T, Li S, Yu X, Yuan Y, Lu S, Liu Z
IEEE Trans Ind Electron [im Druck]
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2024,
Chen Y, Mao L, Zhou Q, Bai D, Kong Y
Brain Res Bull: 111164 [im Druck]
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2024,
Zhao J, Ma J, Wang X, Zhang B
Electromagn Biol Med: 1-16 [im Druck]
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2024,
Boulerbah R, Chaabane A, Attia H, Aissaoui D
2024 3rd International Conference on Advanced Electrical Engineering (ICAEE), Sidi-Bel-Abbes, Algeria. IEEE: S. 1-4; ISBN 9798350349368
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2024,
Jabeen B, Mirani ZA, Lone MA, Nirkhiwale A, Farooqui WA, Aslam K, Ahmed MA, Vohra F
Eur J Dent [im Druck]
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2024,
da Cunha MJ, Pires Dorneles G, Peres A, Maurer S, Horn K, Souza Pagnussat A
Int J Neurosci 134 (12): 1518-1527
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2024,
Prillo J, Zapf L, Espinola CW, Daskalakis ZJ, Blumberger DM
Can J Psychiatry: 7067437241301005 [im Druck]
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2024,
Cho SM, Khanduja S, Wilcox C, Dinh K, Kim J, Kang JK, Chinedozi ID, Darby Z, Acton M, Rando H, Briscoe J, Bush EL, Sair HI, Pitts J, Arlinghaus LR, Wandji AN, Moreno E, Torres G, Akkanti B, Gavito-Higuera J, Keller S, Choi HA, Kim BS, Gusdon A, Whitman GJ, SAFE MRI ECMO Investigators
Circulation 150 (24): 1955-1965
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2024,
Henshaw DL, Philips A
Int J Radiat Biol [im Druck]
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2024,
Xu C, Jin J, Wang X, Liu Z, Yin T, Wang H
2024 5th International Conference on Mechatronics Technology and Intelligent Manufacturing (ICMTIM), Nanjing, China. IEEE: S. 532-541; ISBN 9798350363272
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2024,
Abbas M, Khan SA, Aamir M, Khan NU, Ali U, Ullah S, Basir A, Björninen T
IEEE Access 12: 184853-184860
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2024,
Grob R, Wegmann JW, Rössler W, Fleischmann PN
Curr Biol 34 (24): 5833-5838.e2
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Int J Microw Wirel Technol [im Druck]
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2024,
Kang Q, Roshani Talesh A, Lang EJ, Sahin M
J Neural Eng 21 (6): 066028
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2024,
Ejaz O, Hasan MA, Ashraf M, Qazi SA
Clin EEG Neurosci [im Druck]
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2024,
Martens G, Hody S, Bornheim S, Angius L, De Beaumont L, Fregni F, Ruffini G, Kaux JF, Thibaut A, Bury T
PLoS One 19 (12): e0312084