Die folgenden Begriffe wurden einbezogen:
significant, signifikant, 有意な
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2019,
Wang B, Li J, Jin H, Chen X
2019 12th International Congress on Image and Signal Processing, BioMedical Engineering and Informatics (CISP-BMEI), Suzhou, China. IEEE: S. 1-5; ISBN 978-1-7281-4853-3
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2019,
Weiss RA, Bernardy J
Lasers Surg Med 51 (1): 47-53
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2019,
Buyakova NV, Txao LV, Kryukov AV
2019 International Multi-Conference on Industrial Engineering and Modern Technologies (FarEastCon), Vladivostok, Russia. IEEE: S. 1-5; ISBN 978-1-7281-0062-3
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2019,
Qiu S, Wang S, Yi W, Zhang C, He H
2019 41st Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Berlin, Germany. IEEE: S. 5918-5922; ISBN 978-1-5386-1312-2
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2019,
Liu HH, He XK, Chen HY, Peng CW, Rotenberg A, Juan CH, Pei YC, Liu HL, Chiang YH, Wang JY, Feng XJ, Huang YZ, Hsieh TH
Neural Plast 2019: 4252943
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2019,
Wang N, Ming D, Ke Y, Du J, Liu W, Kong L, Zhao X, Liu S, Xu M, An X
2019 41st Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Berlin, Germany. IEEE: S. 329-332; ISBN 978-1-5386-1312-2
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2019,
Khan A, Haueisen J, Wolters CH, Antonakakis M, Vogenauer N, Wollbrink A, Suntrup-Krueger S, Schneider TR, Herrmann CS, Nitsche M, Paulus W
2019 41st Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Berlin, Germany. IEEE: S. 5894-5897; ISBN 978-1-5386-1312-2
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2019,
Petersen TH, Puthusserypady S
2019 41st Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Berlin, Germany. IEEE: S. 4509-4512; ISBN 978-1-5386-1312-2
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2019,
Lee H, Lee JS, Chung Y, Jung WR, Seong Kang J, Seo DW, Shon YM, Na DL, Joon Kim S
2019 41st Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Berlin, Germany. IEEE: S. 6141-6144; ISBN 978-1-5386-1312-2
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2019,
Thomas C, Huang Y, Faria PC, Datta A
2019 41st Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Berlin, Germany. IEEE: S. 6442-6445; ISBN 978-1-5386-1312-2