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2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: S. 1214-1217; ISBN 978-1-5386-3647-3
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2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE), Amsterdam, Netherlands. IEEE: S. 500-505; ISBN 978-1-4673-9699-8
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2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: S. 4166-4169; ISBN 978-1-5386-3647-3
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2018,
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2018 EMF-Med 1st World Conference on Biomedical Applications of Electromagnetic Fields (EMF-Med), Split, Croatia. IEEE: S. 1-2; ISBN 978-1-5386-5922-9
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2018 EMF-Med 1st World Conference on Biomedical Applications of Electromagnetic Fields (EMF-Med), Split, Croatia. IEEE: S. 1-2; ISBN 978-1-5386-5922-9
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2017 5th IEEE Workshop on Advances in Information, Electronic and Electrical Engineering (AIEEE), Riga, Latvia. IEEE: S. 1-3; ISBN 978-1-5386-4138-5
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2018,
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2017 IEEE 21st International Conference on Pulsed Power (PPC), Brighton, UK. IEEE: S. 1-6; ISBN 978-1-5090-5749-8
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2018,
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2017 Japan-Africa Conference on Electronics, Communications and Computers (JAC-ECC), Alexandria, Egypt. IEEE: S. 144-147; ISBN 978-1-5386-2515-6
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2018,
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2018,
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2018 IEEE International Microwave Biomedical Conference (IMBioC), Philadelphia, PA, USA. IEEE: S. 184-186; ISBN 978-1-5386-5919-9
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2018,
Du X, Ma X, Li L, Li H, Cheng X, Hwang JCM
2018 IEEE/MTT-S International Microwave Symposium - IMS, Philadelphia, PA, USA. IEEE: S. 1148-1151; ISBN 978-1-5386-5068-4
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2018,
Shkliarskyi V, Matiieshyn Y, Grytsay V, Smarkutskyi T, Shckorbatov Y
2018 14th International Conference on Advanced Trends in Radioelecrtronics, Telecommunications and Computer Engineering (TCSET), Lviv-Slavske, Ukraine. IEEE: S. 728-731; ISBN 978-1-5386-2557-6
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2018,
Verma S, Keshri GK, Sharma M, Mani KV, Karmakar S, Chauhan S, Gupta A
2018 IEEE International Microwave Biomedical Conference (IMBioC), Philadelphia, PA, USA. IEEE: S. 175-177; ISBN 978-1-5386-5919-9
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2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI), Long Beach, CA, USA. IEEE: S. 448-453; ISBN 978-1-5386-6622-7