Die folgenden Begriffe wurden einbezogen:
RF, Hochfrequenz, HF, "radio frequency", 無線周波
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2020,
Jung YJ, Ro YS, Ryu HJ, Kim JE
J Cosmet Laser Ther 22 (4-5): 205-209
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2020,
Gobba F, Modonese A
G Ital Med Lav Ergon 42 (4): 304-309
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G Ital Med Lav Ergon 42 (4): 322-328
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2020,
Oddone E, Pernetti R, Malagò G, Taino G
G Ital Med Lav Ergon 42 (4): 315-321
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2020,
Bejenaru O, Lazarescu C, Ursachianu MV, Salceanu A
2020 International Conference and Exposition on Electrical And Power Engineering (EPE), Iasi, Romania. IEEE: S. 322-326; ISBN 978-1-7281-8127-1
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2020,
Paulet MV, Salceanu A, Asiminicesei OM, Neagu CD
2020 International Conference and Exposition on Electrical And Power Engineering (EPE), Iasi, Romania. IEEE: S. 452-456; ISBN 978-1-7281-8127-1
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2020,
Pacurar C, Giurgiuman A, Constantinescu C, Topa V, Munteanu C, Andreica S, Gliga M
2020 International Conference and Exposition on Electrical And Power Engineering (EPE), Iasi, Romania. IEEE: S. 370-375; ISBN 978-1-7281-8127-1
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2020,
Scialacqua L, Mioc F, Scannavini A, Foged LJ
2020 IEEE International Symposium on Antennas and Propagation and North American Radio Science Meeting, Montreal, QC, Canada. IEEE: S. 1827-1828; ISBN 978-1-7281-6671-1
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2020,
He K, Yu M, Zhao E, Li G, Wang M, Ma J
2020 IEEE International Symposium on Antennas and Propagation and North American Radio Science Meeting, Montreal, QC, Canada. IEEE: S. 635-636; ISBN 978-1-7281-6671-1
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2020,
Phaneuf M, Mojabi P
2020 IEEE International Symposium on Antennas and Propagation and North American Radio Science Meeting, Montreal, QC, Canada. IEEE: S. 1377-1378; ISBN 978-1-7281-6671-1
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2020,
Fontana N, Giampietri E, Canicattì E, Brizi D, Monorchio A
2020 IEEE International Symposium on Antennas and Propagation and North American Radio Science Meeting, Montreal, QC, Canada. IEEE: S. 307-308; ISBN 978-1-7281-6671-1
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2020,
Brizi D, Fontana N, Canicatti E, Giampietri E, Monorchio A
2020 IEEE International Symposium on Antennas and Propagation and North American Radio Science Meeting, Montreal, QC, Canada. IEEE: S. 1559-1560; ISBN 978-1-7281-6671-1
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2020,
Neophytou K, Antoniades MA
2020 IEEE International Symposium on Antennas and Propagation and North American Radio Science Meeting, Montreal, QC, Canada. IEEE: S. 1435-1436; ISBN 978-1-7281-6671-1
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2020,
Yamada Y, Kamardin K, Kamaruddin NA, Razali SHM, Zainudin N, Hlaing NW, Ja'afar H
2020 IEEE International RF and Microwave Conference (RFM), Kuala Lumpur, Malaysia. IEEE: S. 1-4; ISBN 978-1-7281-8210-0
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2020,
Alahidin MF, Zakaria NA, Ismail Khan Z, Emileen Abd Rashid N, Shariff KKM, Enche Ab Rahim SA
2020 IEEE International RF and Microwave Conference (RFM), Kuala Lumpur, Malaysia. IEEE: S. 1-4; ISBN 978-1-7281-8210-0
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2020 IEEE 15th International Conference on Industrial and Information Systems (ICIIS), RUPNAGAR, India. IEEE: S. 567-570; ISBN 978-1-7281-8525-5
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2020,
Lu C, Huang X, Rong C, Tao X, Zeng Y, Liu X, Liu M
2020 IEEE 1st China International Youth Conference on Electrical Engineering (CIYCEE), Wuhan, China. IEEE: S. 1-5; ISBN 978-1-7281-9660-2
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National Academies of Sciences, Engineering, and Medicine (NASEM),
1-76, ISBN 978-0-309-68137-7
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2020,
Kojima M, Suzuki Y, Tasaki T, Tatematsu Y, Mizuno M, Fukunari M, Sasaki H
J Infrared Milli Terahz Waves 41: 834–845
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2020,
Jiang L, Cui H, Zhang C, Cao X, Gu N, Zhu Y, Wang J, Yang Z, Li C
Front Aging Neurosci 12: 593000
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2020,
Sakaie KE, Kuban B, Fleischman A, DeBenedictis M, Rachitskaya A, Yuan A, Roy A, Lowe MJ
Magn Reson Imaging 72: 14-18
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2020,
Sri Latha G, Raju GSN, Sunny Dayal PA
2020 32nd International Conference on Microelectronics (ICM), Aqaba, Jordan. IEEE: S. 1-4; ISBN 978-1-7281-9665-7
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2020,
Meenu L, Aiswarya S, Menon SK
2020 5th International Conference on Computing, Communication and Security (ICCCS), Patna, India. IEEE: S. 1-4; ISBN 978-1-7281-9181-2
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2020,
Barudov E, Ivanova M
2020 12th Electrical Engineering Faculty Conference (BulEF), Varna, Bulgaria. IEEE: S. 1-5; ISBN 978-1-7281-9440-0
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2020,
Ijjeh A, Cueille M, Dubard JL, Ney M
2020 IEEE USNC-CNC-URSI North American Radio Science Meeting (Joint with AP-S Symposium), Montreal, QC, Canada. IEEE: S. 17-18; ISBN 978-1-7281-6197-6