-
2010,
Barker SJ, Doyle DJ
Anesth Analg 110 (6): 1517-1518
-
2010,
Wills JH, Ehrenwerth J, Rogers D
Anesth Analg 110 (6): 1647-1649
-
2010,
Schaub M, Aebischer A, Gimenez O, Berger S, Arlettaz R
Biol Conserv 143 (8): 1911-1918
-
2010,
Lehman RN, Savidge JA, Kennedy PL, Harness RE
J Wildl Manage 74 (3): 459-470
-
2010,
Tinto A, Real J, Manosa S
J Wildl Manage 74 (8): 1852-1862
-
2010,
Tayefi H, Kiray A, Kiray M, Ergur BU, Bagriyanik HA, Pekcetin C, Fidan M, Ozogul C
Arch Med Sci 6 (6): 837-842
-
2010,
Chen YC, Chen CC, Tu W, Cheng YT, Tseng FG
J Micromech Microeng 20 (12): 125023
-
J Egypt Public Health Assoc 85 (5-6): 337-345
-
2010,
Perez-Bruzon RN, Figols T, Azanza MJ, del Moral A
J Phys Conf Ser 200: 122008
-
Arbeitsmed Sozialmed Umweltmed 45 (04): 164-169
-
2010,
Sabbatini RME, Siqueira G, Cruz Ornetta V, Taborda R, Skvarca J
Latin American Experts Committee on High Frequency Electromagnetic Fields and Human Health,
1-186
-
2010,
Fang HH, Zeng GY, Nie Q, Kang JB, Ren DQ, Zhou JX, Li YM
Zhonghua Yi Xue Za Zhi 90 (45): 3231-3234
-
2010,
Persinger MA, Saroka KS, Lavallee CF, Booth JN, Hunter MD, Mulligan BP, Koren SA, Wu HP, Gang N
Neurosci Lett 486 (3): 231-234
-
2010,
Jorge-Mora T, Alvarez-Folgueiras M, Leiro J, Jorge-Barreiro FJ, Ares-Pena FJ, Lopez-Martin E
Prog Electromagn Res 100: 351-379
-
2010,
Dodick DW, Schembri CT, Helmuth M, Aurora SK
Headache 50 (7): 1153-1163
-
2010,
Chen BS, Lo YC, Lius YC, Wu SN
Chin J Physiol 53 (6): 423-429
-
2010,
Davis CC, Balzano Q
CR physique 11 (9-10): 585-591
-
Institute of Electrical and Electronics Engineers (IEEE),
IEEE Std C95.3.1-2010: 1-101, ISBN 978-0-7381-6261-4
-
Adv Gerontol 23 (4): 554-556
-
2010,
Laqua D, Just T, Husar P
2010 Annual International Conference of the IEEE Engineering in Medicine and Biology, Buenos Aires, Argentina. IEEE: 1437-1440; ISBN 978-1-4244-4123-5
-
2010,
El-Helaly M, Abu-Hashem E
Indian J Occup Environ Med 14 (3): 66-70
-
2010,
Lazutkin D, Husar P
2010 Annual International Conference of the IEEE Engineering in Medicine and Biology, Buenos Aires, Argentina. IEEE: 581-584; ISBN 978-1-4244-4123-5
-
G Ital Med Lav Ergon 32 (4) Suppl: 160-161
-
IOP Conf Ser: Earth Environ Sci 10 (1): 2006-
-
IOP Conf Ser: Earth Environ Sci 10 (1): 2004-