Die folgenden Begriffe wurden einbezogen:
EMF, "Elektromagnetisches Feld", "electromagnetic field", 電磁界
-
2017,
Zvezdina MY, Shokova YA, Krivtsova MG, Golovko TM, Cherskaya AA
2017 Radiation and Scattering of Electromagnetic Waves (RSEMW), Divnomorskoe, Russia. IEEE: S. 73-76; ISBN 978-1-5386-2783-9
-
2017,
Kuznetsov K, Zakirova A, Averyanov U
2017 International Conference on Industrial Engineering, Applications and Manufacturing (ICIEAM), St. Petersburg, Russia. IEEE: S. 1-4; ISBN 978-1-5090-5649-1
-
2017,
Etem T, Pala Z, Bozkurt I
2017 XIIIth International Conference on Perspective Technologies and Methods in MEMS Design (MEMSTECH), Lviv, Ukraine. IEEE: S. 129-131; ISBN 978-1-5386-4002-9
-
2017,
Griguer H, Tentzeris MM, Nauroze A, Drissi M
2017 XXXIInd General Assembly and Scientific Symposium of the International Union of Radio Science (URSI GASS), Montreal. IEEE, Montreal, Canada: S. 1-4; ISBN 978-90-825987-0-4
-
2017,
Yavolovskaya E, Gabriadze G, Chiqovani G, Jobava R
2017 XXIInd International Seminar/Workshop on Direct and Inverse Problems of Electromagnetic and Acoustic Wave Theory (DIPED), Dnipro. IEEE, Dnipro, Ukraine: S. 183-186; ISBN 978-1-5090-0605-2
-
2017,
Kisel NN, Cheremisov VA, Kisel DV
2017 Progress In Electromagnetics Research Symposium - Spring (PIERS), St. Petersburg, Russia. IEEE: S. 3433-3438; ISBN 978-1-5090-6270-6
-
2017,
Hanzelka M, Dan J, Fiala P, Drexler P, Holcner V, Dohnal P
2017 Progress in Electromagnetics Research Symposium - Fall (PIERS - FALL), Singapore. IEEE, Singapore, Singapore: S. 966-969; ISBN 978-1-5386-1211-8
-
2017,
Gercek C, Magne I, Kourtiche D, Schmitt P, Roth P, Nadi M, Souques M
2017 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Angers. IEEE, Angers, France: S. 1-5; ISBN 978-1-5386-0689-6
-
2017 5th International Conference on Electrical Engineering - Boumerdes (ICEE-B), Boumerdes, Algeria. IEEE: S. 1-6; ISBN 978-1-5386-0687-2
-
2017,
Salih ZH, Hasan GT, Mohammed MA
2017 9th International Conference on Electronics, Computers and Artificial Intelligence (ECAI), Targoviste, Romania. IEEE: S. 1-4; ISBN 978-1-5090-6459-5