Die folgenden Begriffe wurden einbezogen:
conductivity, Leitfähigkeit, conductance, 伝導率
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2019,
Wang Y, Van de Moortele PF, He B
Magn Reson Imaging 63: 258-266
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2019,
Zimin KA, Rubtsova NB, Ryabchenko VN, Tokarskiy AY
2019 PhotonIcs & Electromagnetics Research Symposium - Spring (PIERS-Spring), Rome, Italy. IEEE: S. 1171-1179; ISBN 978-1-7281-3404-8
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2019,
Hossain S, Young B, Bhalla A, Guo R
2019 IEEE International Symposium on Measurement and Control in Robotics (ISMCR), Houston, TX, USA. IEEE: D2-1-1-D2-1-6; ISBN 978-1-7281-4900-4
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2019,
Kundu A, Gupta B, Mallick AI
2019 IEEE Radio and Antenna Days of the Indian Ocean (RADIO), Reunion, France. IEEE: S. 1-2; ISBN 978-1-7281-2299-1
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2019,
Johansson JD, Alonso F, Wardell K
2019 41st Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Berlin, Germany. IEEE: S. 5212-5216; ISBN 978-1-5386-1312-2
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2019,
Small AT, Dougherty ET
2019 41st Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Berlin, Germany. IEEE: S. 2340-2343; ISBN 978-1-5386-1312-2
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2019,
Kroll MW, Kroll LC, Panescu D, Perkins PE, Andrews CJ
2019 41st Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Berlin, Germany. IEEE: S. 1769-1775; ISBN 978-1-5386-1312-2
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2019,
Khan A, Haueisen J, Wolters CH, Antonakakis M, Vogenauer N, Wollbrink A, Suntrup-Krueger S, Schneider TR, Herrmann CS, Nitsche M, Paulus W
2019 41st Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Berlin, Germany. IEEE: S. 5894-5897; ISBN 978-1-5386-1312-2
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2019,
Colella M, Paffi A, Fontana S, Rossano F, De Santis V, Apollonio F, Liberti M
2019 41st Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Berlin, Germany. IEEE: S. 2917-2920; ISBN 978-1-5386-1312-2
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2019,
De Angelis A, Denzi A, Merla C, Andre FM, Garcia-Sanchez T, Mir LM, Apollonio F, Liberti M
2019 49th European Microwave Conference (EuMC), Paris, France. IEEE: S. 212-215; ISBN 978-1-7281-1798-0