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2014 Asia-Pacific Microwave Conference, Sendai, Japan. IEEE: S. 953-955; ISBN 978-4-902339-31-4
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Phan-Huy DT, Kokar Y, Sarrebourse T, Malhouroux-Gaffet N, Pajusco P, Leray C, Gati A, Wiart J
2014 IEEE Globecom Workshops (GC Wkshps), Austin, TX, USA. IEEE: S. 1186-1191; ISBN 978-1-4799-7470-2
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Graziosi F, Bonfiglioli R, Violante FS
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2014 IEEE 11th Consumer Communications and Networking Conference (CCNC), Las Vegas, NV, USA. IEEE: S. 107-114; ISBN 978-1-4799-2356-4
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2014 First International Conference on Computational Systems and Communications (ICCSC), Trivandrum, India. IEEE: S. 293-298; ISBN 978-1-4799-6012-5
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2014 International Conference on Electrical Engineering and Computer Science (ICEECS), Kuta, Bali, Indonesia. IEEE: S. 269-273; ISBN 978-1-4799-8477-0
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Skiljo M, Blazevic Z
2014 22nd International Conference on Software, Telecommunications and Computer Networks (SoftCOM), Split, Croatia. IEEE: S. 14920798; ISBN 978-953-290-052-1
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Kitano Y, Omori H, Morizane T, Kimura N, Nakaoka M
2014 International Power Electronics and Application Conference and Exposition, Shanghai, China. IEEE: S. 778-781; ISBN 978-1-4799-6767-4
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Aravind KA, Krishna B, Devendranath D, Jha IS, Bhowmick BND, Rao SBR, Suresh Kumar BNVRC
2014 IEEE PES T&D Conference and Exposition, Chicago, IL, USA. IEEE: S. 373-377; ISBN 978-1-4799-3657-1
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2014 International Symposium on Electromagnetic Compatibility, Gothenburg, Sweden. IEEE: S. 354-359; ISBN 978-1-4799-3226-9
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2014 International Symposium on Electromagnetic Compatibility, Gothenburg, Sweden. IEEE: S. 348-353; ISBN 978-1-4799-3226-9
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2014 39th International Conference on Infrared, Millimeter, and Terahertz waves (IRMMW-THz), Tucson, AZ, USA. IEEE: S. 14770682; ISBN 978-1-4799-3877-3
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2014,
Ono T, Hikage T, Nojima T, Nagaoka T, Watanabe S
2014 IEEE International Workshop on Electromagnetics (iWEM), Sapporo, Japan. IEEE: S. 209-210; ISBN 978-1-4799-4815-4
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2014,
Alistar BD, Salceanu A, Lupuleasa G
2014 International Conference and Exposition on Electrical and Power Engineering (EPE), Iasi, Romania. IEEE: S. 437-441; ISBN 978-1-4799-5849-8