Die folgenden Begriffe wurden einbezogen:
Hochfrequenz, HF, "radio frequency", RF, 無線周波
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2010,
Hikage T, Kawamura Y, Nojima T, Nagaoka T, Watanabe S
9th International Symposium on EMC Joint with 20th International Wroclaw Symposium on EMC, EMC Europe 2010, Wroclaw, Poland. IEEE: S. 73-76; ISBN 978-83-7493-426-8
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2010,
Carranza Herrezuelo N, Hernández Armas JA, García J, del Pozo A, Herránz Gómez J, Melián del Castillo M, Fernández de Aldecoa JC, Ramos V
9th International Symposium on EMC Joint with 20th International Wroclaw Symposium on EMC, EMC Europe 2010, Wroclaw, Poland. IEEE: S. 691-694; ISBN 978-83-7493-426-8
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2010,
Hirata A, Ito N, Fujiwara O, Nagaoka T, Watanabe S
9th International Symposium on EMC Joint with 20th International Wroclaw Symposium on EMC, EMC Europe 2010, Wroclaw, Poland. IEEE: S. 58-61; ISBN 978-83-7493-426-8
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2010,
Mouthaan R, Loader B, Bownds D, Gregory A
9th International Symposium on EMC Joint with 20th International Wroclaw Symposium on EMC, EMC Europe 2010, Wroclaw, Poland. IEEE: S. 67-72; ISBN 978-83-7493-426-8
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2010 Asia-Pacific International Symposium on Electromagnetic Compatibility, Beijing, China. IEEE: S. 9-12; ISBN 978-1-4244-5622-2
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2010,
Huo X, Jow UM, Ghovanloo M
2010 Annual International Conference of the IEEE Engineering in Medicine and Biology, Buenos Aires, Argentina. IEEE: S. 1425-1428; ISBN 978-1-4244-4124-2
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2010,
Carballo Quintas M, Martinez-Silva I, Cadarso-Suarez C, Jorge-Barreiro FJ, Alvarez-Folgueiras M, Ares-Pena F, López-Martín EJ
Proceedings of the Fourth European Conference on Antennas and Propagation, Barcelona, Spain. IEEE: S. 1-5; ISBN 978-84-7653-472-4
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Deutsche Kommission Elektrotechnik Elektronik Informationstechnik in DIN und VDE (DKE),
DIN EN 60601-1-2 VDE 0750-1-2 Berichtigung 1:2010-05
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2010,
Wiedemann PM, Löchtefeld S, Claus F, Marksthaler S, Peters I
Bundesamt für Strahlenschutz (BfS),
Ressortforschungsberichte zur kerntechnischen Sicherheit und zum Strahlenschutz, BfS-RESFOR-33/10: 1-138
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2010,
Awanti SM, Ingin JB, Jeevangi SR, Patil GA, Awanti BS
J Clin of Diagn Res 4 (4): 2758 - 2762