Die folgenden Begriffe wurden einbezogen:
Frequenz, frequency, 頻度、周波数
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2016,
Marković MD, Marković DM, Dragaš MV, Končar IB, Banzić IL, Ille ME, Davidović LB
Vascular 24 (3): 246-253
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2016,
Zhou Y, Gao Y, Zhen P, Chen K
J Zhejiang Univ (Med Sci) 45 (6): 561-567
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2016,
Vincent M, Rossel O, Duffau H, Bonnetblanc F, Guiraud D
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: S. 4543-4546; ISBN 978-1-4577-0220-4
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2016,
Wenger C, Bomzon Z, Salvador R, Basser PJ, Miranda PC
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: S. 5664-5667; ISBN 978-1-4577-0220-4
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2016,
Denzi A, Merla C, Casciola M, Hwang JC, Cheng X, Apollonio F, Liberti M
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: S. 4232-4235; ISBN 978-1-4577-0220-4
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2016,
Varghese BJ, Bobba PB
2016 IEEE 1st International Conference on Power Electronics, Intelligent Control and Energy Systems (ICPEICES), Delhi, India. 04-06 July 2016; IEEE; ISBN 978-1-4673-8588-6
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2016,
Hershkovich HS, Bomzon Z, Wenger C, Urman N, Chaudhry A, Garcia-Carracedo D, Kirson ED, Weinberg U, Wassermann Y, Palti Y
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: S. 2357-2360; ISBN 978-1-4577-0220-4
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2016,
Macedo M, Wenger C, Salvador R, Fernandes SR, Miranda PC
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: S. 5168-5171; ISBN 978-1-4577-0220-4
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2016,
Cosoli G, Scalise L, Tricarico G, Tomasini EP, Cerri G
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: S. 5652-5655; ISBN 978-1-4577-0220-4
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2016,
Kozlov M, Lucano E, Angelone LM
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: S. 6242-6245; ISBN 978-1-4577-0220-4