Die folgenden Begriffe wurden einbezogen:
Expositionsabschätzung, "exposure assessment", ばく露評価
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2020,
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2020,
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2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: 1-4; ISBN 978-1-7281-5580-7
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2020,
Onishi T, Niskala K, Christ A, Roman J
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2020,
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2020,
Di Francesco A, De Santis V
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2020,
Andrenko AS, Chakarothai J, Wake K, Onishi T
2020 XXXIIIrd General Assembly and Scientific Symposium of the International Union of Radio Science, Rome, Italy. IEEE: 1-2; ISBN 978-1-7281-5690-3
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2020,
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2020 XXXIIIrd General Assembly and Scientific Symposium of the International Union of Radio Science, Rome, Italy. IEEE: 1-3; ISBN 978-1-7281-5690-3
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2020,
Chiaramello E, Tognola G, Bonato M, Gallucci S, Magne I, Souques M, Fiocchi S, Parazzini M, Ravazzani P
2020 XXXIIIrd General Assembly and Scientific Symposium of the International Union of Radio Science, Rome, Italy. IEEE: 1-4; ISBN 978-1-7281-5690-3
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2020,
Bechta K, Grangeat C, Du J
2020 XXXIIIrd General Assembly and Scientific Symposium of the International Union of Radio Science, Rome, Italy. IEEE: 1-4; ISBN 978-1-7281-5690-3
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2020,
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2020,
Šuka D, Pejović P, Simić-Pejović M
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2020,
Bonato M, Chiaramello E, Fiocchi S, Gallucci S, Dossi L, Tognola G, Ravazzani P, Parazzini M
2020 IEEE 20th Mediterranean Electrotechnical Conference ( MELECON), Palermo, Italy. IEEE: 429-433; ISBN 978-1-7281-5201-1
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2020,
Schießl S, Kopacz T, Heberling D
2020 14th European Conference on Antennas and Propagation (EuCAP), Copenhagen, Denmark. IEEE: 1-5; ISBN 978-1-7281-3712-4
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2020,
Reboux S, Pfeifer S, Kuster N
2020 14th European Conference on Antennas and Propagation (EuCAP), Copenhagen, Denmark. IEEE: 1-4; ISBN 978-1-7281-3712-4
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