Die folgenden Begriffe wurden einbezogen:
Berührungsstrom, Kontaktstrom, "touch current", 接触電流
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2019,
Maxwell JR, Kamm C, Grassham CD, Fuller J, Lowe JR, Ianus V
Acta Paediatr 108 (3): 557-558
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2019,
Blandford AD, Wiggins NB, Ansari W, Hwang CJ, Wilkoff BL, Perry JD
Eur J Ophthalmol 29 (3): 315-322
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2019,
Reinbold C, Serror K, Mimoun M, Chaouat M, Marco O, Boccara D
J Burn Care Res 40 (1): 120-127
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2019,
Chabin X, Taghli-Lamallem O, Mulliez A, Bordachar P, Jean F, Futier E, Massoullié G, Andonache M, Souteyrand G, Ploux S, Boirie Y, Richard R, Citron B, Lusson JR, Godet T, Pereira B, Motreff P, Clerfond G, Eschalier R
Clin Nutr 38 (2): 806-811
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2019,
Tashiro J, Burnweit CA
Pediatr Emerg Care 35 (4): 261-264
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2018,
Wu X, Meisner DJ, Stechschulte KD, Simha V, Wellman RJ, Thakur M, Posey KR
2018 IEEE Industry Applications Society Annual Meeting (IAS), Portland, OR, USA. IEEE: S. 1-8; ISBN 978-1-5386-4537-6
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2018,
Trapezon K, Gumen T, Trapezon A
2018 14th International Conference on Advanced Trends in Radioelecrtronics, Telecommunications and Computer Engineering (TCSET), Lviv-Slavske, Ukraine. IEEE: S. 229-232; ISBN 978-1-5386-2557-6
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2018 IEEE PELS Workshop on Emerging Technologies: Wireless Power Transfer (Wow), Montreal, QC, Canada. IEEE: S. 1-5; ISBN 978-1-5386-2466-1
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Deutsche Kommission Elektrotechnik Elektronik Informationstechnik in DIN und VDE (DKE),
DIN VDE 0100-410 VDE 0100-410:2018-10
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2018 IEEE Petroleum and Chemical Industry Technical Conference (PCIC), Cincinnati, OH, USA. IEEE: S. 463-472; ISBN 978-1-5386-4271-9
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International Electrotechnical Commission (IEC),
IEC 60479-1:2018: 1-72, ISBN 978-2-8-3226295-5
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Deutsche Kommission Elektrotechnik Elektronik Informationstechnik in DIN und VDE (DKE),
DIN EN IEC 60974-1:2018-12 VDE 0544-1:2018-12
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2018,
Jeyakumar P, Hussain AT, Ahamed AR
Ann Plast Surg 81 (1): 39-44
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Institute of Electrical and Electronics Engineers (IEEE),
IEEE C95.2-2018: 1-28
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2018,
Kieliszek J, Wyszkowska J
2018 Applications of Electromagnetics in Modern Techniques and Medicine (PTZE), Racławice, Poland. IEEE: S. 101-104; ISBN 978-1-5386-6937-2
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2018 IEEE IAS Electrical Safety Workshop (ESW), Fort Worth, TX, USA. IEEE: S. 1-8; ISBN 978-1-5386-1560-7
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2018 IEEE Symposium on Product Compliance Engineering (ISPCE), San Jose, CA, USA. IEEE: S. 1-6; ISBN 978-1-5386-3433-2
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2018,
Kamimura Y, Inagaki S, Wake K
2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE), Amsterdam, Netherlands. IEEE: S. 855-859; ISBN 978-1-4673-9699-8
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2018,
ISBI Practice Guidelines Committee, Allorto NL, Atieh B, Bolgiani A, Chatterjee P, Cioffi W, Dziewulski P, de Jong A, Gibran N, Guerrero L, Hanumadass ML, Hofland H, Icaza I, Koogewerf K, Li-Tsang C, Mackie D, Nnabuko RE, Oen I, Peck M, Puri V, Riasa NP, Sjoberg F, van Schie C, Wilson Y, Ahuja R, Carrougher G, Cartotto R, Cleland H, Greenhalgh D, Herndon D, Jeng J, Malic C, Moghazy A, Moiemen N, Nnabuko R, Palmieri T, Parry I, Sheridan R, Singer Y, van Zuijlen P, Weber J, Wiechman S
Burns 44 (7): 1617-1706
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2018,
Carman WB, Hampson K, Zeman D
2018 Down to Earth Conference (DTEC), Melbourne, VIC, Australia. IEEE: S. 1-6; ISBN 978-1-7281-0327-3
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2018,
Todak N, White MD, Dario LM, Borrego AR
Eval Rev 42 (3): 358-385
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2018,
Reshetov IV, Petrosyan KA, Antonyan PA, Khachatryan LS
Ann Ital Chir 89 (4): 337-341
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2018,
Ma P, Sun Y, Zhang X, Liu H, Liu C, Zhao J
Disaster Med Public Health Prep 12 (4): 478-485
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2018,
Kang S, Kufta K, Sollecito TP, Panchal N
Burns 44 (5): 1065-1076
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2018,
Han JT, Li J, Gao XW, Jia WB
Zhonghua Shao Shang Za Zhi 34 (8): 513-515
