-
2017,
Mittal L, Raman V, Camarillo IG, Garner AL, Fairbanks AJ, Dunn GA, Sundararajan R
2017 IEEE Conference on Electrical Insulation and Dielectric Phenomenon (CEIDP), Fort Worth, TX, USA. IEEE: S. 596-599; ISBN 978-1-5386-1195-1
-
2017,
Zhou J, Legenzoff Z, Yan X, Yang S, Xiang S, Shinde S, Lee J, Pommerenke D
2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), Tucson, AZ, USA. IEEE: S. 1-7; ISBN 978-1-5090-6499-1
-
2017,
Petrella RA, Schoenbach KH, Xiao S
IEEE Trans Dielectr Electr Insul 24 (4): 2157 - 2163
-
2017,
Monti G, De Paolis MV, Corchia L, Tarricone L
IET Microwaves, Antennas & Propagation 11 (15): 2201 - 2210
-
2017,
Novickij V, Girkontaite I, Zinkeviciene A, Svediene J, Lastauskiene E, Paskevicius A, Markovskaja S, Novickij J
IEEE Trans Magn 53 (11): 2001904
-
2017,
Pratt H, Andrews C, Panescu D, Lake B
2017 39th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Jeju, Korea (South). IEEE: S. 3712-3718; ISBN 978-1-5090-2810-8
-
2017,
Mi Y, Xu J, Tang X, Yao C, Li C
IEEE Trans Dielectr Electr Insul 24 (6): 3985 - 3994
-
2017,
Biswas S, Sikdar D, Das S, Mahadevappa M
2017 39th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Jeju, Korea (South). IEEE: S. 1101-1104; ISBN 978-1-5090-2810-8
-
2017,
Busygina AV, Komnatnov ME
2017 International Multi-Conference on Engineering, Computer and Information Sciences (SIBIRCON), Novosibirsk, Russia. IEEE: S. 386-389; ISBN 978-1-5386-1597-3
-
Nat Rev Neurosci 18 (2): 68