Die folgenden Begriffe wurden einbezogen:
電離, Ionisation, ionization
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2019,
Katkoria V, Ghosh P, Chaudhury B
2019 IEEE MTT-S International Microwave and RF Conference (IMARC), Mumbai, India. IEEE: 1-5; ISBN 978-1-7281-4041-4
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2019,
Prasad KY, Punekar GS
2019 4th International Conference on Electrical, Electronics, Communication, Computer Technologies and Optimization Techniques (ICEECCOT), Mysuru, India. IEEE: 332-335; ISBN 978-1-7281-3262-4
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2019,
Caraiani C, Petresc B, Dong Y, Dietrich CF
Med Ultrason 21 (4): 456-463
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2019 19th International Symposium on Electromagnetic Fields in Mechatronics, Electrical and Electronic Engineering (ISEF), Nancy, France. IEEE: 1-2; ISBN 978-1-7281-1561-0
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2019,
Djuric N, Kavecan N, Kljajic D, Mijatovic G, Djuric S
2019 International Conference on Sensing and Instrumentation in IoT Era (ISSI), Lisbon, Portugal. IEEE: 1-6; ISBN 978-1-7281-1023-3
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2019,
Huang X, Lu C, Tao X, Rong C, Liu M
2019 PhotonIcs & Electromagnetics Research Symposium - Spring (PIERS-Spring), Rome, Italy. IEEE: 4256-4262; ISBN 978-1-7281-3404-8
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2019,
Harimurugan D, Punekar GS, Kishore NK
2019 IEEE International Conference on Distributed Computing, VLSI, Electrical Circuits and Robotics (DISCOVER), Manipal, India. IEEE: 1-5; ISBN 978-1-7281-3736-0
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2019,
Arbeitsgruppe Mobilfunk und Strahlung
Bundesamt für Umwelt (BAFU), Bundesamt für Kommunikation (BAKOM), Eidgenössisches Departement für Umwelt, Verkehr, Energie und Kommunikation (UVEK),
1-125
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2019 14th International Conference on Advanced Technologies, Systems and Services in Telecommunications (TELSIKS), Nis, Serbia. IEEE: 111-116; ISBN 978-1-7281-0879-7
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2019,
Gombarska D, Smetana M, Drozdikova Z
2019 IEEE 20th International Conference on Computational Problems of Electrical Engineering (CPEE), Lviv-Slavske, Ukraine. IEEE: 1-4; ISBN 978-1-7281-2811-5
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2019,
Afolabi OB, Obajuluwa AO, Obajuluwa T, Okiki P, Oloyede OI, Fadaka OA, Ojo OA
Biomed Environ Sci 32 (11): 860-863
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2019,
Alessio N, Santoro E, Squillaro T, Aprile D, Briccola M, Giubbini P, Marchesani R, Muoio MR, Lamberti M
Stem Cells Cloning 12: 49-59
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2019,
Bejenaru O, Lunca E, David V
2019 International Conference on Electromechanical and Energy Systems (SIELMEN), Craiova, Romania. IEEE: 1-4; ISBN 978-1-7281-4012-4
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2019,
Bailey WH, Bodemann R, Bushberg J, Chou CK, Cleveland R, Faraone A, Foster KR, Gettman KE, Graf K, Harrington T, Hirata A, Kavet R, Keshvari J, Klauenberg BJ, Legros A, Maxson DP, Osepchuk JM, Reilly JP, Tell RA, Thansandote A, Yamazaki K, Ziskin MC, Zollman PM
IEEE Access 7: 171346-171356
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2019,
Jadia S, Qureshi S, Jain L, Shringirishi M
Indian J Otolaryngol Head Neck Surg 71 Suppl 2: 1169-1173
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2019,
Said-Salman IH, Jebaii FA, Yusef HH, Moustafa ME
J Biomed Phys Eng 9 (5): 579-586
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2019,
Feng X, Chen X, Wang Y, Wang J
2019 8th International Symposium on Next Generation Electronics (ISNE), Zhengzhou, China. IEEE: 1-3; ISBN 978-1-7281-2063-8
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Strahlenschutzkommission (SSK),
1-65
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2019,
Wen F, Li Q, Li R, Liu L, Wu T
2019 IEEE Innovative Smart Grid Technologies - Asia (ISGT Asia), Chengdu, China. IEEE: 4117-4121; ISBN 978-1-7281-3521-2
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2019,
Mohd Shah SR, Badariah Asan N, Velander J, Ebrahimizadeh J, Perez MD, Mattsson V, Blokhuis T, Augustine R
IEEE Access 7: 156033-156043
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2019,
Migault L, Bowman JD, Kromhout H, Figuerola J, Baldi I, Bouvier G, Turner MC, Cardis E, Vila J
Ann Work Expo Health 63 (9): 1013-1028
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2019,
Elhalel G, Price C, Fixler D, Shainberg A
Sci Rep 9: 1645
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Strahlenschutzkommission (SSK),
1-45
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2019,
IARC Monographs Priorities Group, Marques MM, Berrington de Gonzalez A, Beland FA, Browne P, Demers PA, Lachenmeier DW, Bahadori T, Barupal DK, Belpoggi F, Comba P, Dai M, Daniels RD, Ferreccio C, Grigoriev OA, Hong YC, Hoover RN, Kanno J, Kogevinas M, Lasfargues G, Malekzadeh R, Masten S, Newton R, Norat T, Pappas JJ, Queiroz Moreira C, Rodríguez T, Rodríguez-Guzmán J, Sewram V, Zeise L, Benbrahim-Tallaa L, Bouvard V, Cree IA, El Ghissassi F, Girschik J, Grosse Y, Hall AL, Turner MC, Straif K, Korenjak M, McCormack V, Müller K, Schüz J, Zavadil J, Schubauer-Berigan MK, Guyton KZ
Lancet Oncol 20 (6): 763-764
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Institute of Electrical and Electronics Engineers (IEEE),
IEEE Std C95.1-2019: 1-312, ISBN 978-1-5044-5548-0