Die folgenden Begriffe wurden einbezogen:
電磁界強度, Feldstärke, "field intensity", "field strength"
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2020,
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2020,
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2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: S. 1-5; ISBN 978-1-7281-5580-7
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2020,
Miwa K, Takenaka T, Hirata A
2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: S. 1-4; ISBN 978-1-7281-5580-7
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2020,
Migdał P, Roman P, Strachecka A, Murawska A, Bieńkowski P
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2020,
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IEEE Access 8: 206371-206387
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2020,
Psenakova Z, Benova M, Mydlova J
2020 IEEE 21st International Conference on Computational Problems of Electrical Engineering (CPEE), (Online Conference), Poland. IEEE: S. 1-4; ISBN 978-1-7281-9618-3
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2020,
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2020,
Fetouri B, Ouberehil A, De Doncker P, Wiart J
2020 XXXIIIrd General Assembly and Scientific Symposium of the International Union of Radio Science, Rome, Italy. IEEE: S. 1-3; ISBN 978-1-7281-5690-3
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2020,
Bereta M, Teplan M, Chafai DE, Cifra M
2020 XXXIIIrd General Assembly and Scientific Symposium of the International Union of Radio Science, Rome, Italy. IEEE: S. 1-3; ISBN 978-1-7281-5690-3
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2020,
Ye E, Lee S, Park W, Park E, Cho DW, Jang J, Park SM
IEEE Access 8: 194363-194372
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2020,
Migdał P, Murawska A, Strachecka A, Bieńkowski P, Roman A
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2020,
Chen Y, Gao G, Xiong H, Liu J, Wang Y
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2020,
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IET Sci Meas Technol 14 (8): 914-923
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2020,
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IEEE Letters on Electromagnetic Compatibility Practice and Applications 2 (3): 85-91
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2020,
Carciofi C, Garzia A, Valbonesi S, Gandolfo A, Franchelli R
2020 International Conference on Technology and Entrepreneurship (ICTE), Bologna, Italy. IEEE: S. 1-6; ISBN 978-1-7281-4903-5
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2020,
Buyakova NV, Kryukov AV, Seredkin DA
2020 International Ural Conference on Electrical Power Engineering (UralCon), Chelyabinsk, Russia. IEEE: S. 76-81; ISBN 978-1-7281-6210-2
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Umwelt · Medizin · Gesellschaft 33 (3) Suppl: 1-27
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2020,
Shi W, Grazian F, Dong J, Soeiro TB, Bauer P
2020 IEEE International Symposium on Circuits and Systems (ISCAS), Seville, Spain. IEEE: S. 1-5; ISBN 978-1-7281-3321-8
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2020,
Gao P, Chen Q, Hu J, Lin Y, Lin J, Guo Q, Yue H, Zhou Y, Zeng L, Li J, Ding G, Guo G
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2020 Wireless Telecommunications Symposium (WTS), Washington, DC, USA. IEEE: S. 1-5; ISBN 978-1-7281-4696-6
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2020,
Medeiros HR, Assumpcao JAF, Medeiros LF, Stapenhorst M, Nunes L, Henckes NAC, Cruz CU, Fregni F, Sanches PRS, Oliveira FSO, Caumo W, Cirne-Lima EO, Torres ILS
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2020,
Kazemivalipour E, Vu J, Lin S, Bhusal B, Nguyen BT, Kirsch J, Elahi B, Rosenow J, Atalar E, Golestanirad L
2020 42nd Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC), Montreal, QC, Canada. IEEE: S. 6143-6146; ISBN 978-1-7281-1991-5
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2020,
Saviz M, Faraji-Dana R
IEEE Journal on Multiscale and Multiphysics Computational Techniques 5: 167-175
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2020,
Grant A, Metzger GJ, Van de Moortele PF, Adriany G, Olman C, Zhang L, Koopermeiners J, Eryaman Y, Koeritzer M, Adams ME, Henry TR, Uğurbil K
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PLoS One 15 (8): e0236929
