Die folgenden Begriffe wurden einbezogen:
電気, Elektrizität, electricity
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2016,
Mattei E, Lucano E, Censi F, Angelone LM, Calcagnini G
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: 2361-2364; ISBN 978-1-4577-0220-4
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2016,
Seo H, Kim D, Jun SC
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: 4618-4621; ISBN 978-1-4577-0220-4
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2016,
Wenger C, Bomzon Z, Salvador R, Basser PJ, Miranda PC
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: 5664-5667; ISBN 978-1-4577-0220-4
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2016,
Miranda PC, Salvador R, Wenger C, Fernandes SR
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: 6457-6460; ISBN 978-1-4577-0220-4
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2016,
Gruhn KM, Knossalla F, Schwenkreis P, Hamsen U, Schildhauer TA, Tegenthoff M, Sczesny-Kaiser M
Nervenarzt 87 (6): 623-628
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2016,
Powell ES, Carrico C, Westgate PM, Chelette KC, Nichols L, Reddy L, Salyers E, Ward A, Sawaki L
NeuroRehabilitation 39 (3): 439-449
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2016,
Denzi A, Merla C, Casciola M, Hwang JC, Cheng X, Apollonio F, Liberti M
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: 4232-4235; ISBN 978-1-4577-0220-4
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2016,
Bastos R, Fernandes SR, Salvador R, Wenger C, de Carvalho MA, Miranda PC
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: 1754-1757; ISBN 978-1-4577-0220-4
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2016,
Datta A, Krause MR, Pilly PK, Choe J, Zanos TP, Thomas C, Pack CC
2016 38th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Orlando, FL, USA. IEEE: 1774-1777; ISBN 978-1-4577-0220-4
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2016,
Varghese BJ, Bobba PB
2016 IEEE 1st International Conference on Power Electronics, Intelligent Control and Energy Systems (ICPEICES), Delhi, India. 04-06 July 2016; IEEE; ISBN 978-1-4673-8588-6