Suchergebnisse

2912 Artikel wurden gefunden.

Die folgenden Begriffe wurden einbezogen: 電撃傷, "elektrischer Schlag", Elektrounfall, Stromschlag, Stromunfall, "electrical injury", "electric shock"

• 2019, Zeng J, Zeng Y
  A Lock Unit and Interlocking Device for Electrostatic Precipitator [tech./dosim.]
  2019 2nd World Conference on Mechanical Engineering and Intelligent Manufacturing (WCMEIM), Shanghai, China. IEEE: S. 59-63; ISBN 978-1-7281-5046-8
• 2019, Lee JY
  Electrostatic Discharges and Grounding for Aircraft [Grundlagen]
  2019 IEEE Aerospace Conference, Big Sky, MT, USA. IEEE: S. 1-6; ISBN 978-1-5386-6855-9
• 2019, Coban YK
  Application of the Stromal Vascular Fraction of Adipose Tissue to a Severe Great Toe Defect Resulting from Third-Degree Electrical Burn Injury [med. Anw.]
  J Burn Care Res 40 (6): 1009-1011
• 2019, Vilke G, Chan T, Bozeman WP, Childers R
  [Details] Emergency Department Evaluation After Conducted Energy Weapon Use: Review of the Literature for the Clinician [Review]
  J Emerg Med 57 (5): 740-746
• 2019, Burnham T, Hilgenhurst G, McCormick ZL
  Second-degree Skin Burn from a Radiofrequency Grounding Pad: A Case Report and Review of Risk-Mitigation Strategies [Stromunfall]
  PM&R 11 (10): 1139-1142
• 2019, Lian C, Zhang JZ, Li YR, Liu HL, Liu XJ, Li XL
  Electrical flash burns due to switchboard explosion [Stromunfall]
  Int Wound J 16 (6): 1579-1580
• 2019, Thasneem K, Ratageri VH, Fattepur SR
  Lightning Injury in Children [Stromunfall]
  Indian J Pediatr 86 (10): 969
• 2019, Petley GW, Albon B, Banks P, Roberts PR, Deakin CD
  Leakage current from transvenous and subcutaneous implantable cardioverter defibrillators (ICDs): A risk to the rescuer? [tech./dosim.]
  Resuscitation 137: 148-153
• 2019, Mitra A, Sen A, Shenoy P
  A case of anterior uveitis, macular cyst and retinal detachment following electric shock injury [Stromunfall]
  Indian J Ophthalmol 67 (10): 1730
• 2019, Park SD
  Painful Memories of an Electrical Accident [Grundlagen]
  2019 IEEE IAS Electrical Safety Workshop (ESW), Jacksonville, FL, USA. IEEE: S. 1-4; ISBN 978-1-7281-0645-8