Die folgenden Begriffe wurden einbezogen:
職業ばく露, "berufliche Exposition", "occupational exposure"
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2023,
Bainbridge A, Keevil S
Br J Radiol 96 (1151): 20220692
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2023,
Kodera S, Miura N, Diao Y, Inoue M, Hikage T, Taguchi K, Masuda H, Hirata A
IEEE J Electromagn RF Microw Med Biol 7 (1): 65-72
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2023,
Peleg M, Berry EM, Deitch M, Nativ O, Richter E
Environ Res 216 Pt 2: 114610
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Forensic Sci Med Pathol 19 (1): 91-93
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2023,
Pedrazzi N, Klein H, Gentzsch T, Kim BS, Waldner M, Giovanoli P, Plock J, Schweizer R
Burns 49 (5): 1103-1112
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2023,
Kaergaard A, Nielsen KJ, Carstensen O, Biering K
Acta Ophthalmol 101 (1): e88-e94
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Proc Inst Mech Eng Part M: J Eng Marit Environ 237 (1): 182-191
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2023,
Rangkooy H, Rahmati A, Dehaghi BF
Int J Occup Saf Ergon 29 (2): 863-868
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2023,
Filosa L, Lopresto V
Int J Occup Saf Ergon 29 (2): 735-746
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2023,
Hardell L, Koppel T
Rev Environ Health 38 (2): 219-228
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2023,
Guettler NJ, Cox A, Holdsworth DA, Rajappan K, Nicol ED
Eur J Prev Cardiol 30 (6): 517–519
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2023,
Narang S, Manoharan GK, Dil JS, Raja A
Indian J Neurotrauma 20 (2): 65-70
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2023,
Oruç M, Dündar AS, Okumuş H, Dengeşik Ö, Altın I, Türkmen Şamdancı E, Celbiş O
Aust J Forensic Sci 55 (2): 243-254
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2023,
Bundesanstalt für Arbeitsschutz und Arbeitsmedizin (BAuA)
GMBl [Nr. 3–12]: 235
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2023,
Bundesanstalt für Arbeitsschutz und Arbeitsmedizin (BAuA)
GMBl [Nr. 3–12]: 140
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2023,
Bundesanstalt für Arbeitsschutz und Arbeitsmedizin (BAuA)
GMBl [Nr. 3–12]: 50
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2022,
Guanghui H, Mengmeng S, Feng L, Haixuan L, Rongbo Y, Xiangwen Z
2022 4th International Conference on Smart Power & Internet Energy Systems (SPIES), Beijing, China. IEEE: S. 2189-2193; ISBN 978-1-6654-8958-4
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2022,
Gordon LB, Liechty J, Bradley J, Merrill L, Gauss H
2022 IEEE IAS Electrical Safety Workshop (ESW), Jacksonville, FL, USA. IEEE: S. 1-8; ISBN 978-1-6654-7864-9
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2022,
Ramirez-Bettoni E, Nemeth B
2022 IEEE IAS Electrical Safety Workshop (ESW), Jacksonville, FL, USA. IEEE: S. 1-9; ISBN 978-1-6654-7864-9
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Int J Environ Res Public Health 19 (17): 10564
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Arch Civ Eng 68 (4): 537-554
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2022,
Bräunlich R, Dalmus C, Dongus S, Eberhard J, Friedrich G, Fröhlich J, Röösli M, Schürmann D
Bundesamt für Energie (BFE),
Statusbericht 2022: 1-204
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2022,
Ivanova M, Barudov E
2022 14th Electrical Engineering Faculty Conference (BulEF), Varna, Bulgaria. IEEE: S. 1-4; ISBN 978-1-6654-9027-6
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2022,
Mocanu M, Huchitu A, Gandescu CH, Gkanatsios S
UPB Sci Bull, Series C: Electr Eng Comput Sci 84 (4): 323-338
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2022,
Krupski P, Michalowska J
Prz Elektrotechniczny 98 (12): 217-220
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2022,
Nataraja Moorthy T, Shari N, Rajesh Kumar N
J Krishna Inst Med Sci Univ 11 (3): 90-94
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2022,
Amicucci GL, Settino MT
2022 International Conference on Electrical, Computer, Communications and Mechatronics Engineering (ICECCME), Maldives, Maldives. IEEE: S. 1-7; ISBN 978-1-6654-7096-4
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J Comput Methods Sci Eng 22 (6): 2257-2266
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2022,
Wei S, Zhou C, Huang L
Lasers Med Sci 38 (1): 25
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2022,
Nourredine T, Rabah D, Abdechafik H
2022 19th International Multi-Conference on Systems, Signals & Devices (SSD), Sétif, Algeria. IEEE: S. 1813-1819; ISBN 978-1-6654-7109-1
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2022,
Shaikh SA, Telang PA, Arora S
Cureus 14 (11): e31176
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2022,
Wyszkowska J, Pritchard C
Int J Environ Res Public Health 19 (23): 16150
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2022,
Alyami AS, Majrashi NA, Shubayr NA, Alatwah SM, Alyami J
J Med Imaging Radiat Sci 53 (4): 633-639
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2022 IEEE International Conference on High Voltage Engineering and Applications (ICHVE), Chongqing, China. IEEE: S. 1-4; ISBN 978-1-6654-0751-9
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2022,
Pavel I, David V, Roman MG, Bordas AM
2022 International Conference and Exposition on Electrical And Power Engineering (EPE), Iasi, Romania. IEEE: S. 484-488; ISBN 978-1-6654-8995-9
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2022,
Oh S, Hong SE, Choi HD
Int J Environ Res Public Health 19 (22): 15185
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2022,
Eblen ML, Ramirez-Bettoni E, Wallace K
2022 IEEE IAS Electrical Safety Workshop (ESW), Jacksonville, FL, USA. IEEE: S. 1-7; ISBN 978-1-6654-7864-9
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2022,
Wold A, Rådman L, Norman K, Olausson H, Thordstein M
Brain Sci 12 (10): 1301
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2022,
Ramos V, Suárez OJ, Suárez S, Febles VM, Aguirre E, Zradziński P, Rabassa LE, Celaya-Echarri M, Marina P, Karpowicz J, Falcone F, Hernández JA
Appl Sci 12 (20): 10667
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2022,
Martinho E, Santos SR, de Souza DF
2022 IEEE IAS Electrical Safety Workshop (ESW), Jacksonville, FL, USA. IEEE: S. 1-7; ISBN 978-1-6654-7864-9
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Energies 15 (19): 7230
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2022,
Yamaguchi-Sekino S, Iwakiri K, Sekino M, Nakai T
IEEJ Trans Electr Electron Eng 17 (7): 981-985
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2022,
Hammen L, Pichon L, Le Bihan Y, Bensetti M, Fleury G
2022 International Symposium on Electromagnetic Compatibility – EMC Europe, Gothenburg, Sweden. IEEE: S. 114-119; ISBN 978-1-6654-0789-2
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2022,
Barbosa Filho JML, Campos MMdM, Flor DL, Alves WS, D’Assunção AG, Rodrigues MEC, de Sousa VAJr
Sensors 22 (18): 7017
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2022,
Djuric N, Kljajic D, Gavrilov T, Markovic Golubovic N, Djuric S
2022 IEEE International Symposium on Measurements & Networking (M&N), Padua, Italy. IEEE: S. 1-6; ISBN 978-1-6654-8363-6
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2022,
Keshavarzi A, Rahgozar Z, Mortazavi M, Dehghani A
World J Plast Surg 11 (2): 102-109
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2022,
Raz-Steinkrycer LS, Dubnov J, Gelberg S, Jia P, Portnov BA
Sustainability 14 (17): 11065
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2022,
Acri G, Anfuso C, Vermiglio G, Hartwig V
Electronics 11 (17): 2796
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2022,
Ozkan B, Albayati A, Savran S, Uysal CA
Turk J Plast Surg 30 (3): 79-81
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2022,
Göcsei G, Németh B, Rácz L, Lipovits Z
2022 13th International Conference on Live Maintenance (ICOLIM), Turin, Italy. IEEE: S. 1-4; ISBN 978-1-6654-7421-4