-
2014,
Sunohara T, Laakso I, Hirata A, Onishi T
2014 International Symposium on Electromagnetic Compatibility, Tokyo, Japan. IEEE: 449-452; ISBN 978-4-88552-287-1
-
2014,
Kim M, Kim S, Ahn S, Chun Y, Park S
2014 International Symposium on Electromagnetic Compatibility, Tokyo, Japan. IEEE: 426-429; ISBN 978-4-88552-287-1
-
2014,
Cabot E, Zastrow E, Kuster N
2014 International Symposium on Electromagnetic Compatibility, Tokyo, Japan. IEEE: 237-240; ISBN 978-4-88552-287-1
-
2014,
Laakso I, Shimamoto T, Hirata A, Feliziani M
2014 International Symposium on Electromagnetic Compatibility, Tokyo, Japan. IEEE: 430-433; ISBN 978-4-88552-287-1
-
2014,
Kang WG, Alexander Z, Jun HY, Park YH, Pack JK
2014 International Symposium on Electromagnetic Compatibility, Tokyo, Japan. IEEE: 198-201; ISBN 978-4-88552-287-1
-
2014 International Symposium on Electromagnetic Compatibility, Tokyo, Japan. IEEE: 194-197; ISBN 978-4-88552-287-1
-
2014,
Iwamoto T, Arima T, Uno T, Iwamoto T, Wake K, Fujii K, Watanabe S
2014 International Symposium on Electromagnetic Compatibility, Tokyo, Japan. IEEE: 529-532; ISBN 978-4-88552-287-1
-
2014 International Symposium on Electromagnetic Compatibility, Tokyo, Japan. IEEE: 625-628; ISBN 978-4-88552-287-1
-
2014,
Miyaji Y, Shimada M, Mizuno Y, Naito K
2014 International Symposium on Electromagnetic Compatibility, Tokyo, Japan. IEEE: 621-624; ISBN 978-4-88552-287-1
-
2014 International Symposium on Electromagnetic Compatibility, Tokyo, Japan. IEEE: 206-209; ISBN 978-4-88552-287-1