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2018 IEEE PELS Workshop on Emerging Technologies: Wireless Power Transfer (Wow), Montreal, QC, Canada. IEEE: 1-5; ISBN 978-1-5386-2466-1
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2018,
Felício JM, Costa JR, Fernandes CA
IEEE J Electromagn RF Microw Med Biol 2 (1): 25-32
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Attaran A, Handler WB, Wawrzvn K, Chronik BA
2018 IEEE Canadian Conference on Electrical & Computer Engineering (CCECE), Quebec, QC, Canada. IEEE: 1-4; ISBN 978-1-5386-2411-1
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2018,
Soontornpipit P, Satitvipawee P
2018 International Electrical Engineering Congress (iEECON), Krabi, Thailand. IEEE: 1-4; ISBN 978-1-5386-2318-3
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2018,
Brown JE, Qiang R, Stadnik PJ, Stotts LJ, Von Arx JA
2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Honolulu, HI, USA. IEEE: 3866-3869; ISBN 978-1-5386-3647-3
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2018,
Lyu H, Wang J, La JH, Chung JM, Babakhani A
IEEE Trans Biomed Circuits Syst 12 (5): 1131-1143
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IEEE Trans Antennas Propag 66 (12): 7378-7382
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2018 12th International Conference on Sensing Technology (ICST), Limerick, Ireland. IEEE: 319-323; ISBN 978-1-5386-5148-3
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Ibrahim A, Meng M, Kiani M
IEEE Sens J 18 (9): 3813-3826
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2018,
Rahman M, Ahmed F, Rahman AMA
2018 4th International Conference on Electrical Engineering and Information & Communication Technology (iCEEiCT), Dhaka, Bangladesh. IEEE: 148-151; ISBN 978-1-5386-8280-7
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2018,
Liorni I, Neufeld E, Kuehn S, Kuster N
2018 IEEE Wireless Power Transfer Conference (WPTC), Montreal, QC, Canada. IEEE: 1-3; ISBN 978-1-5386-5160-5
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2018,
Periyasamy M, Dhanasekaran R, Mahendran G
2018 International Conference on Communication and Signal Processing (ICCSP), Chennai, India. IEEE: 0911-0917; ISBN 978-1-5386-3522-3
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2018,
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19th International Conference Computational Problems of Electrical Engineering, Banska Stiavnica, Slovakia. IEEE: 1-4; ISBN 978-1-5386-7896-1
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2018,
Zradzinski P, Karpowicz J, Gryz G
2018 EMF-Med 1st World Conference on Biomedical Applications of Electromagnetic Fields (EMF-Med), Split, Croatia. IEEE: 1-2; ISBN 978-1-5386-5922-9
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2018,
Beygi M, Mumcu G, Saddow SE
SoutheastCon 2018, St. Petersburg, FL, USA. IEEE: 1-2; ISBN 978-1-5386-6134-5