Die folgenden Begriffe wurden einbezogen:
放送, Rundfunk, Radio, broadcast
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2022,
Fatani F, Akhter Z, Shamim A
2022 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting (AP-S/URSI), Denver, CO, USA. IEEE: S. 1034-1035; ISBN 978-1-6654-9659-9
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2022,
Yang X, Zheng J, Chen J
2022 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting (AP-S/URSI), Denver, CO, USA. IEEE: S. 1718-1719; ISBN 978-1-6654-9659-9
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2022 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting (AP-S/URSI), Denver, CO, USA. IEEE: S. 101-102; ISBN 978-1-6654-9659-9
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2022,
Ullah I, Wagih M, Beeby S
2022 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting (AP-S/URSI), Denver, CO, USA. IEEE: S. 2010-2011; ISBN 978-1-6654-9659-9
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2022,
Alshammari A, Iqbal A, Denidni TA, Mabrouk IB
2022 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting (AP-S/URSI), Denver, CO, USA. IEEE: S. 109-110; ISBN 978-1-6654-9659-9
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2022,
Chaouche YB, Nedil M
2022 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting (AP-S/URSI), Denver, CO, USA. IEEE: S. 1882-1883; ISBN 978-1-6654-9659-9
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2022,
Wang Y, Xu Y, Wang B, Mo J, Ramahi OM
2022 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting (AP-S/URSI), Denver, CO, USA. IEEE: S. 2020-2021; ISBN 978-1-6654-9659-9
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2022,
Patrício S, Correia LM, Gomes M
2022 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting (AP-S/URSI), Denver, CO, USA. IEEE: S. 1280-1281; ISBN 978-1-6654-9659-9
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2022,
Rotundo S, Brizi D, Monorchio A
2022 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting (AP-S/URSI), Denver, CO, USA. IEEE: S. 1330-1331; ISBN 978-1-6654-9659-9
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2022,
Guo R, Xia M, Zheng J, Chen J, Shrivastava D
2022 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC), Beijing, China. IEEE: S. 210-212; ISBN 978-1-6654-1672-6