Die folgenden Begriffe wurden einbezogen:
強磁性, Ferromagnetismus, ferromagnetism
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2020,
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2020,
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2020,
Li H, Ren H, Qiao CC, Wang M, Zhang Z
2020 13th International Congress on Image and Signal Processing, BioMedical Engineering and Informatics (CISP-BMEI), Chengdu, China. IEEE: S. 619-623; ISBN 978-0-7381-0546-8
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2020 Ural Symposium on Biomedical Engineering, Radioelectronics and Information Technology (USBEREIT), Yekaterinburg, Russia. IEEE: S. 147-151; ISBN 978-1-7281-3166-5
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2020,
Panych LP, Kimbrell VK, Mukundan Jr S, Madore B
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2020,
Belyaev VK, Rodionova VV, Grunin AA, Inoue M, Fedyanin AA
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Jaroszewski M, Thomas S, Rane AV (Hrsg.): Advanced Materials for Electromagnetic Shielding: Fundamentals, Properties, and Applications. John Wiley & Sons, Inc.; S. 109-146; ISBN 978-1-119-12861-8
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2019,
Choi BG, Sohn YH, Lee ES, Han SH, Kim HR, Rim CT
IEEE Transactions on Power Electronics 34 (3): 2539-2552
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2019,
Hossain S, Young B, Bhalla A, Guo R
2019 IEEE International Symposium on Measurement and Control in Robotics (ISMCR), Houston, TX, USA. IEEE: D2-1-1-D2-1-6; ISBN 978-1-7281-4900-4
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2019,
Krstić DD, Zigar DN, Marković V, Perov S, Jovanović U, Malenović Nikolić J
2019 14th International Conference on Advanced Technologies, Systems and Services in Telecommunications (TELSIKS), Nis, Serbia. IEEE: S. 117-120; ISBN 978-1-7281-0879-7
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2019,
Heinrich A, Dorschel J, Mohammad Mashoor M, Guttler F, Teichgraber U
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2019,
Wang CX, Hilburn IA, Wu DA, Mizuhara Y, Cousté CP, Abrahams JNH, Bernstein SE, Matani A, Shimojo S, Kirschvink JL
eNeuro 6 (2)
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Radiologe 59 (10): 860-868
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2019,
Esquivel DMS, Wajnberg E, de Menezes E Souza LC, Acosta-Avalos D, Pinho MB, Harada AY
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2019,
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2018,
Poon S, Chen YH, Wendolowski SF, Graver A, Nixon R, Amaral T, DiMauro JP, Walz DM, Gecelter RC, Grande DA
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2018,
Purnell MC, Butawan MBA, Ramsey RD
Physiol Rep 6 (11): e13722
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2018,
Shokrollahi S, Ghanati F, Sajedi RH, Sharifi M
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2018,
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2017,
Beiu C, Toader C, Golovanov N, Buica G
2017 International Conference on Electromechanical and Power Systems (SIELMEN), Iasi, Romania. IEEE: S. 179-183; ISBN 978-1-5386-1847-9
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2017,
Mavrogeni SI, Poulos G, Kolovou G, Theodorakis G
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2017,
Goncalves FJT, Paterson GW, McGrouther D, Drysdale T, Togawa Y, Schmool DS, Stamps RL
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PLoS One 12 (3): e0173887
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2016,
da Silva JA, Dobránszki J
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2016,
Sarnthein J, Lüchinger R, Piccirelli M, Regli L, Bozinov O
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