Die folgenden Begriffe wurden einbezogen:
ハザード, Gefährdungspotenzial, Hazard
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2020,
Zhang W, Song G, Zhao Q, Qi X
2020 6th Global Electromagnetic Compatibility Conference (GEMCCON), XI'AN, China. IEEE: S. 1-4; ISBN 978-1-7281-8464-7
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2020,
Gascho D, Tappero C, Zoelch N, Deininger-Czermak E, Richter H, Thali MJ, Schaerli S
Forensic Sci Med Pathol 16 (1): 20-31
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2020,
Petrov PK, Velev GT, Ivanov KM, Varbov TK
2020 7th International Conference on Energy Efficiency and Agricultural Engineering (EE&AE), Ruse, Bulgaria. IEEE: S. 1-5; ISBN 978-1-7281-0363-1
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2020 IEEE 15th International Conference on Industrial and Information Systems (ICIIS), RUPNAGAR, India. IEEE: S. 567-570; ISBN 978-1-7281-8525-5
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2020,
Meenu L, Aiswarya S, Menon SK
2020 5th International Conference on Computing, Communication and Security (ICCCS), Patna, India. IEEE: S. 1-4; ISBN 978-1-7281-9181-2
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2020,
Camponogara M, Marchesan APG, Bernardon DP, Marchesan TB, Pepe FC, dos Santos GJG, de Chiara LM
2020 IEEE PES Transmission & Distribution Conference and Exhibition - Latin America (T&D LA), Montevideo, Uruguay. IEEE: S. 1-6; ISBN 978-1-7281-4156-5
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2020,
Vahidnia R, John Dian F
2020 11th IEEE Annual Information Technology, Electronics and Mobile Communication Conference (IEMCON), Vancouver, BC, Canada. IEEE: S. 116-120; ISBN 978-1-7281-8417-3
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2020,
Zradziński P, Karpowicz J, Gryz K, Morzyński L, Młyński R, Swidziński A, Godziszewski K, Ramos V
Sensors 20 (24): E7131
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2020,
Al-Khlaiwi TM, Habib SS, Meo SA, Alqhtani MS, Ogailan AA
Pak J Med Sci 36 (7): 1628-1633
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2020,
Ramos V, Trillo AM, Suarez OJ, Suarez S, Febles VM, Rabassa LE, Karpowicz J, Fernandez de Aldecoa JC, Hernandez JA
2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: S. 1-5; ISBN 978-1-7281-5580-7