Die folgenden Begriffe wurden einbezogen:
ドシメトリ, Dosimetrie, dosimetry
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2019,
Kageyama I, Masuda H, Morimatsu Y, Ishitake T, Sakakibara K, Hikage T, Hirata A
2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Sapporo/APEMC), Sapporo, Japan. IEEE: S. 766-769; ISBN 978-1-7281-1639-6
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2019,
He Y, Leung PSW, Chow Y, Diao Y
2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Sapporo/APEMC), Sapporo, Japan. IEEE: S. 750-753; ISBN 978-1-7281-1639-6
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2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Sapporo/APEMC), Sapporo, Japan. IEEE: S. 691-694; ISBN 978-1-7281-1639-6
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2019,
Feng Z, Diao Y, Sun W, He Y, Leung PSW
2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Sapporo/APEMC), Sapporo, Japan. IEEE: S. 48-51; ISBN 978-1-7281-1639-6
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2019 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Barcelona, Spain. IEEE: S. 1020-1024; ISBN 978-1-7281-0595-6
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2019,
Nefzi A, Carr L, Arnaud-Cormos D, Leveque P
2019 European Microwave Conference in Central Europe (EuMCE), Prague, Czech Republic. IEEE: S. 631-634; ISBN 978-1-7281-1240-4
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2019,
Pääkkönen R, Korpinen L
Radiat Prot Dosimetry 187 (2): 268-271
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2019,
Gomez-Tames J, Tarnaud T, Miwa K, Hirata A, Van de Steene T, Martens L, Tanghe E, Joseph W
IEEE Trans Electromagn Compat 61 (6): 1944 - 1952
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2019,
Qureshi MRA, Alfadhl Y, Chen X
2016 IEEE International Symposium on Antennas and Propagation (APSURSI), Fajardo, PR, USA. IEEE: S. 1631-1632; ISBN 978-1-5090-2887-0
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2019,
Bonato M, Chiaramello E, Fiocchi S, Tognola G, Parazzini M, Ravazzani P
2019 41st Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Berlin, Germany. IEEE: S. 6910-3913; ISBN 978-1-5386-1312-2