Die folgenden Begriffe wurden einbezogen:
ドシメトリ, Dosimetrie, dosimetry
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2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: S. 1-4; ISBN 978-1-7281-5580-7
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2020,
Miwa K, Takenaka T, Hirata A
2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: S. 1-4; ISBN 978-1-7281-5580-7
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2020,
Murakawa T, Diao Y, Rashed EA, Kodera S, Tanaka Y, Kamimura Y, Kitamura S, Uehara S, Otaka Y, Hirata A
IEEE Access 8: 200995-201004
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2020,
Asadi R, Aliakbarian H, Khayambashi G, Majdolashrafi P
IEEE Electromagn Compat Mag 9 (3): 45-54
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2020,
Susnjara A, Poljak D
2020 International Conference on Software, Telecommunications and Computer Networks (SoftCOM), Split, Hvar, Croatia. IEEE: S. 1-5; ISBN 978-1-7281-7538-6
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2020,
Tognola G, Masini B, Gallucci S, Bonato M, Fiocchi S, Chiaramello E, Dossi L, Parazzini M, Ravazzani P
2020 XXXIIIrd General Assembly and Scientific Symposium of the International Union of Radio Science, Rome, Italy. IEEE: S. 1-4; ISBN 978-1-7281-5690-3
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2020,
Bonato M, Dossi L, Chiaramello E, Fiocchi S, Gallucci S, Tognola G, Ravazzani P, Parazzini M
2020 XXXIIIrd General Assembly and Scientific Symposium of the International Union of Radio Science, Rome, Italy. IEEE: S. 1-3; ISBN 978-1-7281-5690-3
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2020,
Chiaramello E, Tognola G, Bonato M, Gallucci S, Magne I, Souques M, Fiocchi S, Parazzini M, Ravazzani P
2020 XXXIIIrd General Assembly and Scientific Symposium of the International Union of Radio Science, Rome, Italy. IEEE: S. 1-4; ISBN 978-1-7281-5690-3
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2020,
Augé S, Tamra A, Rigal L, Lobjois V, Ducommun B, Dubuc D, Grenier K
2020 IEEE/MTT-S International Microwave Symposium (IMS), Los Angeles, CA, USA. IEEE: S. 508-511; ISBN 978-1-7281-6816-6
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2020,
Liorni I, Capstick M, van Wel L, Wiart J, Joseph W, Cardis E, Guxens M, Vermeulen R, Thielens A
Radiat Prot Dosimetry 190 (4): 459-472