-
2021,
Zheng Y, Xia P, Dong L, Tian L, Xiong C
Electromagn Biol Med 40 (2): 274-285
-
2021,
Takembo CN, Sone EM
Heliyon 7 (1): e06132
-
2021,
Lee JU, Shin W, Lim Y, Kim J, Kim WR, Kim H, Lee JH, Cheon J
Nat Mater 20 (7): 1029-1036
-
2021,
Abashina T, Vainshtein M
Electromagn Biol Med 40 (1): 222-226
-
Toxins 13 (1): E48
-
2021,
Kundu A, Vangaru S, Bhattacharyya S, Mallick AI, Gupta B
Bioelectromagnetics 42 (2): 173-185
-
2021,
Cantu JC, Tolstykh GP, Tarango M, Beier HT, Ibey BL
J Membr Biol 254 (2): 141-156
-
Bioelectrochemistry 138: 107727
-
2021,
Park Y, Shin S, Kang H
Acc Chem Res 54 (2): 323-331
-
2021,
Wood A, Karipidis K
Radiat Res 195 (1): 101-113
-
2021,
Zablotskii V, Polyakova T, Dejneka A
Bioelectromagnetics 42 (1): 27-36
-
2021,
Habib M, Horne DA, Hussein K, Coughlin D, Waldorff EI, Zhang N, Ryaby JT, Lotz JC
Tissue Eng Part A 27 (5-6): 402-412
-
2021,
Hunting ER, Matthews J, de Arróyabe Hernáez PF, England SJ, Kourtidis K, Koh K, Nicoll K, Harrison RG, Manser K, Price C, Dragovic S, Cifra M, Odzimek A, Robert D
Int J Biometeorol 65 (1): 45-58
-
2020,
Calabro E, Magazu S
Wirel Pers Commun 115 (2): 1387-1399
-
J Magn 25 (4): 511-516
-
2020,
Yang J, Zhang H, Shang P
Chin Sci Bull 65 (13): 1238-1250
-
2020,
Radil R, Barabas J, Janousek L, Judakova Z, Kamencay P
2020 ELEKTRO, Taormina, Italy. IEEE: S. 1-4; ISBN 978-1-7281-7543-0
-
2020,
Andjusic L, Milankov Z, Maric D, Milosevic B, Djokovic R, Cincovic M, Lalic N, Spasic Z
Thai J Vet Med 50 (4): 535-542
-
2020,
Novikov VV, Yablokova EV, Fesenko EE
Appl Sci 10 (9): 3326
-
2020,
Escobar JF, Vaca-González JJ, Guevara JM, Garzón-Alvarado DA
Eng Rep 2 (2): e12125
-
2020,
Zhao Z, Zhu K, Li Y, Zhu Z, Pan L, Pan T, Borgens RB, Zhao M
Bioelectricity 2 (4): 372-381
-
Electromagn Biol Med 39 (2): 89-96
-
2020,
Ranieri F, Mariotto S, Dubbioso R, Di Lazzaro V
Front Neurol 11: 605335
-
2020,
Prathyusha KR, Pagonabarraga I, Kumar PBS
Phys Rev E 102 (6): 062413
-
2020,
Savchenko V, Synyavskiy O, Dudnyk A, Nesvidomin A, Ramsh V, Bunko V
2020 IEEE KhPI Week on Advanced Technology (KhPIWeek), Kharkiv, Ukraine. IEEE: S. 193-198; ISBN 978-0-7381-4241-8