Die folgenden Begriffe wurden einbezogen:
"sham exposure", Schein-Exposition, Schein-Befeldung, 擬似ばく露
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1996,
Kavaliers M, Ossenkopp KP, Prato FS, Innes DG, Galea LA, Kinsella DM, Perrot-Sinal TS
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1996,
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1996,
Cleary SF, Du Z, Cao G, Liu LM, McCrady C
FASEB J 10 (8): 913-919
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1996,
Miyakoshi J, Ohtsu S, Shibata T, Takebe H
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1996,
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1996,
Lin H, Blank M, Jin M, Goodman R
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1996,
Cleary SF, Cao G, Liu LM
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1996,
Sasser LB, Morris JE, Miller DL, Rafferty CN, Ebi KL, Anderson LE
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1996,
Graham C, Cook MR, Riffle DW, Gerkovich MM, Cohen HD
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1996,
Selmaoui B, Lambrozo J, Touitou Y
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1996,
Mnaimneh S, Bizri M, Veyret B
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1996,
Tanioka N, Sawada S, Hosokawa T
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1996,
Korpinen L, Partanen J
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1996,
Barbier E, Dufy B, Veyret B
Bioelectromagnetics 17 (4): 303-311
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1996,
Wolke S, Neibig U, Elsner R, Gollnick F, Meyer R
Bioelectromagnetics 17 (2): 144-153
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1996,
Stern S, Laties VG, Nguyen QA, Cox C
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1996,
Sienkiewicz ZJ, Larder S, Saunders RD
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1995,
Korpinen L, Partanen J
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1995,
Meyer R, Gollnick F, Wolke S
Edition Wissenschaft 2: 3-36
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1995,
Guanghui C, Li-Ming L, Cleary SF
Bioelectrochem Bioenerg 37 (2): 131-140
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1995,
Santini MT, Cametti C, Paradisi S, Straface E, Donelli G, Indovina PL, Malorni W
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1995,
Jauchem JR, Frei MR
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