Die folgenden Begriffe wurden einbezogen:
"ionisierende Strahlung", "ionizing radiation", 電離放射線
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2021,
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2021,
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Energies 13 (14): 3635
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2020,
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2020,
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2020,
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2020,
Ghnimi S, Gharsallah A
J Electr Syst 16 (1): 134-145
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Electr Eng 102 (2): 1005-1019
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2020,
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2020,
Christopher B, Mary YS, Khandaker MU, Bradley DA, Chew MT, Jojo PJ
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2020,
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J Appl Sci Eng 23 (2): 279-287
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2020,
Laurier D, Röösli M
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2020,
International Commission on Non-Ionizing Radiation Protection (ICNIRP)
Health Phys 118 (6): 683-685
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2020,
Gobba F, Modonese A
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2020,
Bejenaru O, Lazarescu C, Ursachianu MV, Salceanu A
2020 International Conference and Exposition on Electrical And Power Engineering (EPE), Iasi, Romania. IEEE: S. 322-326; ISBN 978-1-7281-8127-1
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2020,
Ayinmode BO, Farai IP
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2020,
Kim K, Lee YS, Kim N, Choi HD, Kang DJ, Kim HR, Lim KM
Int J Mol Sci 22 (1): E170
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2020,
Carlberg M, Koppel T, Hedendahl LK, Hardell L
Int J Environ Res Public Health 17 (23): E9129
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2020,
Xue X, Ali YF, Liu C, Hong Z, Luo W, Nie J, Li B, Jiao Y, Liu NA
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2020,
Soldati M, Laakso I
IEEE Access 8: 222297-222309
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2020,
Li H, Ren H, Qiao CC, Wang M, Zhang Z
2020 13th International Congress on Image and Signal Processing, BioMedical Engineering and Informatics (CISP-BMEI), Chengdu, China. IEEE: S. 619-623; ISBN 978-0-7381-0546-8
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2020,
Keshmiri S, Gholampour N, Mohtashami V
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Gen Physiol Biophys 39 (6): 531-544
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2020,
Vilagosh Z, Lajevardipour A, Wood A
Sci Rep 10: 1479
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2020,
Kiouvrekis Y, Manios G, Tsitsia V, Gourzoulidis G, Kappas C
Environ Res 191: 109940
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2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: S. 1-5; ISBN 978-1-7281-5580-7
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2020,
Dergham I, Martinez Rocha JC, Imad R, Alayli Y
2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: S. 1-5; ISBN 978-1-7281-5580-7
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2020,
Lämmle T, Parspour N, Mönch M
2020 5th International Conference on Smart and Sustainable Technologies (SpliTech), Split, Croatia. IEEE: S. 1-6; ISBN 978-1-7281-7363-4
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2020,
Borzoueisileh S, Shabestani Monfared A, Ghorbani H, Mortazavi SMJ, Zabihi E, Pouramir M, Shafiee M, Niksirat F
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2020,
Dos Santos MAL, de Santana FS, Soares AF, de Sousa SF, Menezes LS, Takeshita WM
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2020,
Dondoladze K, Nikolaishvili M, Museliani T, Jikia G, Zurabashvili D
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2020,
Mohammad M, Pries JL, Onar OC, Galigekere VP, Su GL
2020 IEEE Energy Conversion Congress and Exposition (ECCE), Detroit, MI, USA. IEEE: S. 842-849; ISBN 978-1-7281-5827-3
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2020,
Alcocer G, Alcocer P, Marquez C
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International Electrotechnical Commission (IEC), Institute of Electrical and Electronics Engineers (IEEE),
IEC/IEEE 62704-4:2020: 1-104, ISBN 978-2-8-3228535-0
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2020,
Djekidel R, Bessedik SA, Akef S
IET Sci Meas Technol 14 (8): 914-923
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2020,
Samaniego J, Chuchon M, Adriano R, Inca S
2020 IEEE XXVII International Conference on Electronics, Electrical Engineering and Computing (INTERCON), Lima, Peru. IEEE: S. 1-4; ISBN 978-1-7281-9378-6
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2020,
Dasdag O, Adalier N, Dasdag S
Biotechnol Biotechnol Equip 34 (1): 1087-1094
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2020 Wireless Telecommunications Symposium (WTS), Washington, DC, USA. IEEE: S. 1-5; ISBN 978-1-7281-4696-6
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2020,
Borzoueisileh S, Shabestani Monfared A, Ghorbani H, Mortazavi SMJ, Zabihi E, Pouramir M, Doustimotlagh AH, Shafiee M, Niksirat F
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2020,
Gouarderes S, Mingotaud AF, Vicendo P, Gibot L
Expert Opin Drug Deliv 17 (12): 1703-1726
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2020,
Zhang Y, Wang J, Liu X, Ding L, Wu X, He M, Hou H, Ruan G, Lai J, Chen C
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2020,
Righi H, Arruda-Neto JDT, Gomez JGC, da Silva LF, Somessari ESR, Lemos ACC
J Biol Phys 46 (3): 309-324
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2020,
He W, Xu B, Yao Y, Colombi D, Ying Z, He S
IEEE Access 8: 148214-148225
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2020,
Hardell L, Carlberg M
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2020,
Modenese A, Gobba F
2020 IEEE International Conference on Environment and Electrical Engineering and 2020 IEEE Industrial and Commercial Power Systems Europe (EEEIC / I&CPS Europe), Madrid, Spain. IEEE: S. 1-6; ISBN 978-1-7281-7456-3
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2020,
Cornacchia S, La Tegola L, Maldera A, Pierpaoli E, Tupputi U, Ricatti G, Eusebi L, Salerno S, Guglielmi G
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2020,
Regrain C, Caudeville J, de Seze R, Guedda M, Chobineh A, De Doncker P, Petrillo L, Chiaramello E, Parazzini M, Joseph W, Aerts S, Huss A, Wiart J
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