Die folgenden Begriffe wurden einbezogen:
"exposure assessment", Expositionsabschätzung, ばく露評価
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2024,
Adda S, Bottura V, D'Elia S, Pasquino N, Suman R, Vaccarono M
2024 IEEE International Symposium on Measurements & Networking (M&N), Rome, Italy. IEEE: 1-5; ISBN 9798350370546
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2024,
Franci D, Pavoncello S, Coltellacci S, Strappini M, Aureli T, Marsico G
2024 IEEE International Symposium on Measurements & Networking (M&N), Rome, Italy. IEEE: 1-5; ISBN 9798350370546
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2024,
Redondi AEC, Innamorati C, Gallucci S, Fiocchi S, Matera F
IEEE Access [im Druck]
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2024,
Ajmal A, Yamazaki K, Tamura N, Ait Bamai Y, Yoshikawa T, Hikage T, Ikeda A, Kishi R
Environ Res: 119715 [im Druck]
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2024,
Yang Y, Masini BM, Vermeeren G, Van Den Akker D, Aerts S, Verloock L, Chiaramello E, Bonato M, Wiart J, Tognola G, Joseph W
IEEE Access [im Druck]
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2024,
Camera F, Merla C, De Santis V
Bioengineering 11 (7): 712
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2024,
Gallucci S, Benini M, Bonato M, Galletta V, Tognola G, Parazzini M
2024 IEEE MTT-S International Microwave Biomedical Conference (IMBioC), Montreal, QC, Canada. IEEE, Kanada: 173-175; ISBN 9798350351064
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2024,
Stroka S, Kasolis F, Haußmann N, Clemens M
2024 IEEE 21st Biennial Conference on Electromagnetic Field Computation (CEFC), Jeju, Republic of Korea. IEEE: 1-2; ISBN 9798350348965
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2024,
Kranold L, Jingtian X, Goren T, Kuster N
2024 IEEE MTT-S International Microwave Biomedical Conference (IMBioC), Montreal, QC, Canada. IEEE, Kanada: 119-121; ISBN 9798350351064
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2024,
Kuster N, Chitnis N, Karimi F, Christ A, Kühn S
2024 IEEE MTT-S International Microwave Biomedical Conference (IMBioC), Montreal, QC, Canada. IEEE, Kanada: 111-112; ISBN 9798350351064