Die folgenden Begriffe wurden einbezogen:
"elektromagnetische Interferenz", "electromagnetic interference", 電磁干渉
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2024,
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2024,
Zivaljevic D, Jovanovic D, Krasic D, Cvetkovic N, Petkovic B
Electronics 13 (22): 4551
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2024,
Fu Y, Luo J, Wang C
2024 International Symposium on Electrical, Electronics and Information Engineering (ISEEIE), Leicester, United Kingdom. IEEE: S. 245-251; ISBN 9798350355789
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2024,
Wu N, Mao P, Chang N, Zhou Y, Yang W, Fu F, Liu X, Ji T, Zhao J, Huang Y, Li Y, Dickey MD, Gong W
ACS Nano 18 (49): 33319-33329
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2024,
Ackmann J, Steven D
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2024,
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2024,
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2024 IEEE International Conference And Exposition On Electric And Power Engineering (EPEi), Iasi, Romania. IEEE: S. 533-537; ISBN 9798350356205
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2024,
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2024,
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2024,
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2024,
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2024,
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2024 International Conference on Applied and Theoretical Electricity (ICATE), Craiova, Romania. IEEE: S. 1-6; ISBN 9798350388114
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2024,
Li J, Xie Z, Zhan H, Cai G, Zhuang Y
2024 3rd International Conference on Artificial Intelligence and Computer Information Technology (AICIT), Yichang, China. IEEE: S. 1-4; ISBN 9798350365450
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2024,
Guo R, Wang Z, Wang J, Li C, Li Y, Hu S
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2024,
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2024 25th International Conference on Computational Problems of Electrical Engineering (CPEE), Stronie Śląskie, Poland. IEEE: S. 1-4; ISBN 9798331506650
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2024,
Li Y, Mo C, Li J, Yang P, Wang J, Yu H, Hu S, Zhang P, Liu X
IEEE Trans Instrum Meas 73: 1-9
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2024,
Kang JK, Etchill E, Verdi K, Velez AK, Kearney S, Dodd-O J, Bush E, By S, Boskamp E, Wilcox C, Choi CW, Kim BS, Whitman GJR, Cho SM
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2024,
Zuo Z, Wang Q, Zheng J, Jeong H, Kumar A, Chen J
2024 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI), Phoenix, AZ, USA. IEEE: S. 369-373; ISBN 9798350360400
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2024,
Huang X, Scoles S, Nguyen P, Chen J, Wisniewski J, Wan Y, Jiang GJ
2024 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI), Phoenix, AZ, USA. IEEE: S. 365-368; ISBN 9798350360400
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2024,
Pandeya M, Solanki MS, Suresh VG
2024 2nd World Conference on Communication & Computing (WCONF), RAIPUR, India. IEEE: S. 1-5; ISBN 9798350395334
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2024,
Shafiq Z, Li T, Xia J, Li S, Yang X, Zhao Y
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