Suchergebnisse

793 Artikel wurden gefunden.

Die folgenden Begriffe wurden einbezogen: "electromagnetic compatibility", "elektromagnetische Verträglichkeit", EMC, EMV, 電磁両立性

• 1991, Eicher B, Stäger C, Herzig R, Urech M
  Are the Limits of Exposure to Electromagnetic Fields Valid for Human Health Only ? [temp.]
  9th International Zurich Symposium and Technical Exhibition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: S. 355-358; ISBN 978-1-5090-3194-8
• 1991, Stuchly SS, Stuchly MA
  Evaluation of Electric Fields Induced in Biological Systems [temp.]
  9th International Zurich Symposium and Technical Exhibition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: S. 329-330; ISBN 978-1-5090-3194-8
• 1991, Bassen HI
  Photonic Probes for Measuring Internal E Fields in Biological Subjects Exposed to EMP Simulator Fields [temp.]
  9th International Zurich Symposium and Technical Exhibition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: S. 331-336; ISBN 978-1-5090-3194-8
• 1991, Anderson LE
  Biological Effects of Electromagnetic Fields [Grundlagen]
  9th International Zurich Symposium and Technical Exhibition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: S. 321-322; ISBN 978-1-5090-3194-8
• 1991, Ma MT, Larsen EB, Crawford ML
  Electromagnetic Fields with Arbitrary Wave Impedances Generated Inside a TEM Cell [tech./dosim.]
  IEEE Trans Electromagn Compat 33 (4): 358-362
• 1991, Chen JY, Gandhi OP, Conover DL
  SAR and induced current distributions for operator exposure to RF dielectric sealers [tech./dosim.]
  IEEE Trans Electromagn Compat 33 (3): 252-261
• 1990, Hauser JP
  A 20 Hz to 200 kHz magnetic flux probe for EMI surveys [tech./dosim.]
  IEEE Trans Electromagn Compat 32 (1): 67-69
• 1989, Kamimura Y, Tokushige K
  Exposure to the near Field of an RF Plastic Sealer [tech./dosim.]
  8th International Zurich Symposium and Technical Exhibition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: S. 531-536; ISBN 978-1-5090-3193-1
• 1987, Machczyński W
  Potential Distribution along Earth Return Circuits Exposed to the Induction Field of a Power Line [tech./dosim.]
  7th International Zurich Symposium and Technical Exhibition on Electromagnetic Compatibility, Zurich, Switzerland. IEEE: S. 413-416; ISBN 978-1-5090-3192-4
• 1987, Kim HI
  Regulatory and Social Implications of Electromagnetic Compatibility: A Brief Survey of United States Law [Grundlagen]
  7th International Zurich Symposium and Technical Exhibition on Electromagnetic Compatibility, Zurich, Switzerland. IEEE: S. 239-244; ISBN 978-1-5090-3192-4